Excerpt from Transmission/Reflection and Short-Circuit Line Methods for Measuring Permittivity and Permeability
The transmission/ reflection and short-circuit line methods for measuring complex permit tivity and permeability of materials in waveguides and coaxial lines are examined. Equa tions for complex permittivity and permeability are developed from first principles. In addition, new formulations for the determination of complex permittivity and permeabil ity independent of reference plane position are derived. For the one - sample transmis sion/ reflection method and two-position short-circuit line measurements, the solutions are unstable at frequencies corresponding to integral multiples of one-half wavelength in the sample. For two-sample methods the solutions are unstable for frequencies where both samples resonate simultaneously. Criteria are given for sample lengths to maintain stabil ity. An optimized solution is also presented for the scattering parameters. This solution is stable over all frequencies and is capable of reducing scattering parameter data on ma terials with higher dielectric constant. An uncertainty analysis for the various techniques is developed and the results are compared. The errors incurred due to the uncertainty in scattering parameters, length measurement and reference plane position are used as inputs to the uncertainty models.
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Paperback. Zustand: New. Print on Demand. This book is an in-depth and comprehensive exploration of transmission line measuring techniques for the precise calculation of the permittivity and permeability of materials, offering a detailed review of various algorithms for combined permeability and permittivity determination. It delves into both traditional and optimized solution methodologies, providing invaluable insights into the practicalities of these techniques and their limitations. The author meticulously analyzes uncertainty in measurement processes and presents robust solutions that enhance the accuracy of results. This book is an essential guide for researchers and practitioners in the fields of material science, microwave engineering, and electromagnetics. By providing a thorough understanding of the strengths and weaknesses of different measuring techniques, it empowers readers to make informed choices and obtain reliable material characterization data. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Bestandsnummer des Verkäufers 9781527839885_0
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PAP. Zustand: New. New Book. Shipped from UK. Established seller since 2000. Bestandsnummer des Verkäufers LX-9781527839885
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PAP. Zustand: New. New Book. Shipped from UK. Established seller since 2000. Bestandsnummer des Verkäufers LX-9781527839885
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