A Bibliography on Methods for the Measurement of Inhomogeneities in Semiconductors (1953-1967) (Classic Reprint) - Softcover

Name: A Bibliography on Methods for the Measurement of Inhomogeneities in Semiconductors (1953-1967) (Classic Reprint)
Author: Schafft, Harry A.
ISBN: 9781527923881

Schafft, Harry A.

9781527923881: A Bibliography on Methods for the Measurement of Inhomogeneities in Semiconductors (1953-1967) (Classic Reprint)

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ISBN 10: 1527923886 ISBN 13: 9781527923881

Verlag: FB&C LTD, 2017

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Excerpt from A Bibliography on Methods for the Measurement of Inhomogeneities in Semiconductors (1953-1967)

Key Words: bibliography; semiconductor material inhomogeneities; measurement method5� photovoltaic, electron voltaic, photo conductivity, point potential probe, spreading resistance, voltage breakdown.

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This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.

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Verlag: FB&C LTD
Erscheinungsdatum: 2017
Sprache: Englisch
ISBN 10: 1527923886
ISBN 13: 9781527923881
Einband: Taschenbuch
Anzahl der Seiten: 58
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A Bibliography on Methods for the Measurement of Inhomogeneities in

Harry A. Schafft, Susan Gayle Needham

Verlag: Forgotten Books, 2024

ISBN 10: 1527923886 ISBN 13: 9781527923881

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Paperback. Zustand: New. Print on Demand. This book is a unique reference tool for anyone interested in the detection and location of various inhomogeneities in semiconductors such as variations in impurity concentration, resistivity, diffusion length, and surface recombination velocity. These inhomogeneities, which are significant in the fabrication, operation, and reliability of semiconductor devices, have diverse causes that range from crystal imperfections to intentional doping. The author provides a comprehensive overview of the topic by classifying the inhomogeneities according to their type and material, then detailing their effects on electrical properties. This book also offers theoretical and experimental analyses and reviews of measurement techniques that can be used to detect these inhomogeneities, making it suitable for both the researcher and the practicing engineer. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Bestandsnummer des Verk�ufers 9781527923881_0

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