Verwandte Artikel zu An Introduction to Logic Circuit Testing (Synthesis...
An Introduction to Logic Circuit Testing (Synthesis Lectures on Digital Circuits and Systems) - Softcover
Inhaltsangabe
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Reseña del editor
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
Gebraucht kaufen
Zustand: BefriedigendEx-library with the usual features...
Diesen Artikel anzeigen
EUR 26,52
EUR 36,05 für den Versand von USA nach Deutschland
Versandziele, Kosten & Dauer
Suchergebnisse für An Introduction to Logic Circuit Testing (Synthesis...
Beispielbild für diese ISBN
An Introduction to Logic Circuit Testing
Anbieter: BookOrders, Russell, IA, USA
Verkäuferbewertung 5 von 5 Sternen
Soft Cover. Zustand: Good. Ex-library with the usual features. Library label on front cover. The interior is clean and tight. Binding is good. Cover shows light wear. Ex-Library. Bestandsnummer des Verkäufers 122109
Anzahl: 1 verfügbar