Characterization in Silicon Processing (Materials Characterization) - Hardcover

Strausser, Yale E.

Hardcover

ISBN 10: 1606501097 ISBN 13: 9781606501092

Verlag: Momentum Press, 2009

Inhaltsangabe

With a focus on the use of materials characterization techniques for silicon-based semiconductors, this volume in the Materials Characterization series focuses on the process flow of silicon wafer manufacture where materials properties, processing and associated problems are brought to the fore. The book is organized by the types of materials commonly associated with integrated silicon semiconductor circuits and the typical processes involved for each such material, including deposition, thermal treatment, and lithography. Readers will find features such as:
The essential processes of Silicon Epitaxial
Growth Coverage of Polysilicon Conductors, Silicides, Aluminum and Copper-based Conductors, Tungsten-based Conductors
Concise summaries of major characterization technologies for silicon and related semiconductor materials, including Auger Electron Spectroscopy, Energy-Dispersive X-Ray Spectroscopy, Neutron Activation Analysis and Raman Spectroscopy

Über diesen Titel

Über die Autorin bzw. den Autor

Yale E. Strausser

Details zur Ausgabe

• Verlag: Momentum Press
• Erscheinungsdatum: 2009
• Sprache: Englisch
• ISBN 10: 1606501097
• ISBN 13: 9781606501092
• Einband: Gebundene Ausgabe
• Anzahl der Seiten: 240
• Kontakt zum Hersteller: Nicht verfügbar
• Verantwortliche Person: Nicht verfügbar