Atomic Force Microscopy (NanoScience and Technology) - Hardcover

Voigtländer, Bert

Hardcover

ISBN 10: 3030136531 ISBN 13: 9783030136536

Verlag: Springer, 2019

Inhaltsangabe

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

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Über die Autorin bzw. den Autor

Prof. Dr. rer. nat. Bert Voigtländer studied Physics at the University of Cologne and the RWTH Aachen University, earning his Ph.D. in 1989. While a postdoctoral researcher at the IBM Research Center in Yorktown Heights, USA, he began his current field of research using scanning probe microscopy. As a staff scientist at the Jülich Research Centre (Forschungszentrum Jülich), his recent focus has been nanoscale charge transport measurements. In 2012, he founded the spin-off company mProbes, which offers multi-tip scanning probe microscopes. To date, he has authored and co-authored over 100 peer-reviewed publications.

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This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.

Details zur Ausgabe

• Verlag: Springer
• Erscheinungsdatum: 2019
• Sprache: Englisch
• ISBN 10: 3030136531
• ISBN 13: 9783030136536
• Einband: Gebundene Ausgabe
• Auflage: 2
• Anzahl der Seiten: 345
• Kontakt zum Hersteller: ProductSafety@springernature.com; ProductSafety@springernature.com; ; Poststr. 9; Darmstadt; 64293; Deutschland