Trace-Based Post-Silicon Validation for VLSI Circuits (Lecture Notes in Electrical Engineering, 252, Band 252) - Hardcover

Liu, Xiao; Xu, Qiang

Hardcover

ISBN 10: 3319005324 ISBN 13: 9783319005324

Verlag: Springer, 2013

Inhaltsangabe

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective.  A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.

Über diesen Titel

Über die Autorin bzw. den Autor

Dr. Aswani Kumar Cherukuri is a Professor (Higher Academic Grade) of School of Computer Science Engineering & Information Systems, Vellore Institute of Technology, Vellore, India. His research interests are machine learning, information security and quantum computing. In particular, his work is focused on encrypted network traffic analysis, machine learning techniques. Also, he has interests in post quantum cryptography. He published more than 190 research papers and has 4100+ citations and h-index of 31 as per Google scholar. He executed as principal investigator, different research projects of worth 10 million USD from various funding agencies of India. He has guided 8 PhD research scholars and few foreign interns. He has received awards including Young Scientist Fellowship, Inspiring Teacher Award, Educator excellence award, etc. He is editorial board member of several international journals. He is a member of IEEE, Senior Member of ACM, Vice Chair of IEEE Educational Taskforce on Datamining. Dr. Sumaiya Thaseen Ikram is an Associate Professor (Senior) in the School of Computer Science and Information Systems in Vellore Institute of Technology, Vellore with 18 years of teaching and research experience. She has expertise in Cryptography, Network Security, Software Security, Intrusion Detection Systems, Artificial Intelligence, Image Processing, Ethical hacking, Vulnerability Assessment and Penetration Testing. She has 1400+ citations and h-index of 15 in google scholar and most of her research works are published in high impact factor journals. She is a reviewer for many journals of Wiley, Elsevier, and Springer publishers. She is a certified ethical hacker, certified penetration testing engineer and certified computer hacking forensic investigator. She has successfully completed a research project as a Co-PI funded by MHRD worth Rs.63 lakhs between 2019-2023 in collaboration with Deakin University, Australia. She also completed a consultancy project worth Rs.6 lakhs in the domain of full stack development in the year 2022. She has delivered many expert talks in the domain of Intrusion detection Systems in Taylors University, Malaysia and Deakin University, Australia. Dr. Gang Li is the university academic board member and full professor at Deakin University, and he is the AI director in the Strategic Research Center of Cyber Resilience and Trust (CREST). His research includes data mining, privacy preservation, group behavior analysis and business intelligence. He holds one international patent, and he has co-authored nine papers that won best paper prizes, including Springer's Journal of IT & Tourism best paper award in 2023, KSEM 2018 best paper award, IFITT Journal Paper of the Year 2018/2015, ACM/IEEE ASONAM2012 best paper award, the 2008 Nightingale Prize by Springer, etc. Dr. Xiao Liu received his bachelor's and master's degrees in information management and information system from the School of Management, Hefei University of Technology, Hefei, China, in 2004 and 2007, respectively, and his Ph.D. degree in computer science and software engineering from the Faculty of Information and Communication Technologies, Swinburne University of Technology, Melbourne, Australia, in 2011. He was an Associate Professor at the Software Engineering Institute, East China Normal University, Shanghai, China, during 2013 to 2015. He is currently an Associate Professor and Director for the Software Engineering Innovation Lab with the School of Information Technology, Deakin University, Australia. His research interests include workflow systems, cloud and edge computing, big data analytics, social network, and human-centric software engineering. He is a Senior Member of ACM and IEEE.

Von der hinteren Coverseite

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.

· Provides a comprehensive summary of state-of-the-art on post-silicon validation;

· Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer;

· Illustrate key concepts and algorithms with real examples.

Details zur Ausgabe

• Verlag: Springer
• Erscheinungsdatum: 2013
• Sprache: Englisch
• ISBN 10: 3319005324
• ISBN 13: 9783319005324
• Einband: Gebundene Ausgabe
• Anzahl der Seiten: 123
• Kontakt zum Hersteller: ProductSafety@springernature.com; ProductSafety@springernature.com; ; Poststr. 9; Darmstadt; 64293; Deutschland