Spectroscopic Ellipsometry for Photovoltaics: Volume 1: Fundamental Principles and Solar Cell Characterization (Springer Series in Optical Sciences, 212, Band 212) - Hardcover

Hardcover

ISBN 10: 3319753754 ISBN 13: 9783319753751

Verlag: Springer, 2019

Inhaltsangabe

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.

The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

Über diesen Titel

Über die Autorin bzw. den Autor

Hiroyuki Fujiwara received the Ph.D. degree from Tokyo Institute of Technology. He was a research associate at The Pennsylvania State University. In 1998, he joined Electrotechnical laboratory, Ministry of International Trade and Industry, Japan. Later in 2007, he became a team leader of Research Center for Photovoltaics, National Institute of Advanced Industrial Science and Technology (AIST) in Japan. He is currently a  professor in the Department of Electrical, Electronic and Computer Engineering, Gifu University. 

Robert W. Collins received the Ph.D. degree from Harvard University. He worked at BP America/Standard Oil Co. In 1992, he became a professor of Physics and Materials Research at The Pennsylvania State University. He is currently a Distinguished University Professor and NEG Endowed Chair of Silicate and Materials Science with the Department of Physics and Astronomy, University of Toledo. He co-directs the Center for Photovoltaics Innovation and Commercialization.

Von der hinteren Coverseite

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.

The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

Details zur Ausgabe

• Verlag: Springer
• Erscheinungsdatum: 2019
• Sprache: Englisch
• ISBN 10: 3319753754
• ISBN 13: 9783319753751
• Einband: Gebundene Ausgabe
• Auflage: 1
• Anzahl der Seiten: 614
• Herausgeber: Fujiwara Hiroyuki, Collins Robert W.
• Kontakt zum Hersteller: Springer Nature Customer Service Center GmbH; ProductSafety@springernature.com; ; Europaplatz 3; Heidelberg; 69115; Deutschland