In this research book found the Methods for detecting decision patterns on software metrics for single and associated multiple projects while implantation of SDLC Phases for reinforced taking optimal way for decision making which helps a lot for client in terms of business process improvement.In our first model, a preprocessed based hybrid Bayesian network was implemented to handle large number of metrics for multi-defect decision patterns and other a new ensemble defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns and also establishing a new privacy preserving based defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns.
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Dr.M.Nageswara Rao is Distinguished Professor, Inventor, Author and Business leader Born in India. He Received his M.Tech(CSE) & PhD(Computer Science & Technology) from ANU University and SKU University. Dr.M. Nageswara Rao early worked in IT industry with Product and Services related to Software, with few MNC's LIKE IBM,EDS.
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Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In this research book found the Methods for detecting decision patterns on software metrics for single and associated multiple projects while implantation of SDLC Phases for reinforced taking optimal way for decision making which helps a lot for client in terms of business process improvement.In our first model, a preprocessed based hybrid Bayesian network was implemented to handle large number of metrics for multi-defect decision patterns and other a new ensemble defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns and also establishing a new privacy preserving based defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns. 200 pp. Englisch. Bestandsnummer des Verkäufers 9783330049550
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Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Moparthi Nageswara RaoDr.M.Nageswara Rao is Distinguished Professor, Inventor, Author and Business leader Born in India. He Received his M.Tech(CSE) & PhD(Computer Science & Technology) from ANU University and SKU University. Dr.M. . Bestandsnummer des Verkäufers 151234596
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Taschenbuch. Zustand: Neu. Decision Patterns on Software Metrices for Single& Multiple Projects | Nageswara Rao Moparthi (u. a.) | Taschenbuch | 200 S. | Englisch | 2017 | LAP LAMBERT Academic Publishing | EAN 9783330049550 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. Bestandsnummer des Verkäufers 108575228
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Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -In this research book found the Methods for detecting decision patterns on software metrics for single and associated multiple projects while implantation of SDLC Phases for reinforced taking optimal way for decision making which helps a lot for client in terms of business process improvement.In our first model, a preprocessed based hybrid Bayesian network was implemented to handle large number of metrics for multi-defect decision patterns and other a new ensemble defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns and also establishing a new privacy preserving based defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 200 pp. Englisch. Bestandsnummer des Verkäufers 9783330049550
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Taschenbuch. Zustand: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - In this research book found the Methods for detecting decision patterns on software metrics for single and associated multiple projects while implantation of SDLC Phases for reinforced taking optimal way for decision making which helps a lot for client in terms of business process improvement.In our first model, a preprocessed based hybrid Bayesian network was implemented to handle large number of metrics for multi-defect decision patterns and other a new ensemble defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns and also establishing a new privacy preserving based defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns. Bestandsnummer des Verkäufers 9783330049550
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