This text discusses the interplay between calculated surface plots and experimentally obtained images. A rational interpretation of the high-resolution features of experimentally obtained atomic scale images is essential for the application of STM and AFM for surface analysis.
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Sergei N. Magonov, Myung-Hwan Whangbo Surface Analysis with STM and AFM Experimental and Theoretical Aspects of Image Analysis Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to a lack of the proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical image analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip force induced surface corrugations. Practical examples are taken from:
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