Verwandte Artikel zu Surface Analysis with STM and AFM: Experimental and...

Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis - Hardcover

Magonov, Sergei N; Whangbo, Myung-Hwan

 
9783527293131: Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis
Hardcover
ISBN 10: 3527293132 ISBN 13: 9783527293131
Verlag: Wiley-VCH, 1996

Von der hinteren Coverseite

Sergei N. Magonov, Myung-Hwan Whangbo Surface Analysis with STM and AFM Experimental and Theoretical Aspects of Image Analysis Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to a lack of the proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical image analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip force induced surface corrugations. Practical examples are taken from:

  • inorganic layered materials
  • organic conductors
  • organic adsorbates at liquid ? solid interfaces
  • self-assembled amphiphiles
  • polymers
This book will be an invaluable reference work for researchers active in STM and AFM as well as for newcomers to the field.

„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.

Verlag
Wiley-VCH
Erscheinungsdatum
1996
Sprache
Englisch
ISBN 10 
3527293132
ISBN 13 
9783527293131
Einband
Gebundene Ausgabe
Anzahl der Seiten
316
Kontakt zum Hersteller
WROX
https://www.wiley.com/en-us

111 River Street
Hoboken
NJ
7030
USA
Verantwortliche Person
Buchpark GmbH
gpsr@buchpark.de

Krügerweg 1
Trebbin
Brandenburg
14959
Deutschland