Methods (v. 2) (Handbook of Microscopy: Applications in Materials Science, Solid-state Physics and Chemistry) - Softcover

Amelinckx, S.

 
9783527294732: Methods (v. 2) (Handbook of Microscopy: Applications in Materials Science, Solid-state Physics and Chemistry)
Softcover
ISBN 10: 3527294732 ISBN 13: 9783527294732
Verlag: Wiley-VCH Verlag GmbH, 1996

Inhaltsangabe

Handbook of Microscopy Applications in Materials Science, Solid-State Physics and Chemistry Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which technique is suitable for characterizing a given material?" From the Contents: Electron Microscopy: Scanning Beam Methods, Magnetic Methods: NMR-Microscopy, Scanning Electron Microscopy with Polarization Analysis (SEMPA). Emission Methods: Photoemission Electron Microscopy, Field Emission Microscopy (FEM), Field Ion Microscopy. Scanning Point Probe Techniques: Scanning Tunnelling Microscopy STM, Atomic Force Microscopy AFM, Magnetic Force Microscopy MFM, Ballistic Electron Emission Microscopy (BEEM), Methods Under Development. Image Recording, Handling and Processing: Electronic Image Recording. Image Processing Special Topics: Coincidence Microscopy, Low Energy Holography.

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.

Von der hinteren Coverseite

Handbook of Microscopy Applications in Materials Science, Solid-State Physics and Chemistry Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which technique is suitable for characterizing a given material?" From the Contents: Electron Microscopy: Scanning Beam Methods, Magnetic Methods: NMR-Microscopy, Scanning Electron Microscopy with Polarization Analysis (SEMPA). Emission Methods: Photoemission Electron Microscopy, Field Emission Microscopy (FEM), Field Ion Microscopy. Scanning Point Probe Techniques: Scanning Tunnelling Microscopy STM, Atomic Force Microscopy AFM, Magnetic Force Microscopy MFM, Ballistic Electron Emission Microscopy (BEEM), Methods Under Development. Image Recording, Handling and Processing: Electronic Image Recording. Image Processing Special Topics: Coincidence Microscopy, Low Energy Holography.

„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.

Verlag
Wiley-VCH Verlag GmbH
Erscheinungsdatum
1996
Sprache
Englisch
ISBN 10 
3527294732
ISBN 13 
9783527294732
Einband
Tapa blanda
Anzahl der Seiten
507
Herausgeber
Amelinckx S., Etc.
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
Nicht verfügbar