Electron Microscopy: Principles and Fundamentals - Hardcover

Hardcover

ISBN 10: 3527294791 ISBN 13: 9783527294794

Verlag: Wiley-VCH Verlag GmbH, 1997

Inhaltsangabe

Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.

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Von der hinteren Coverseite

Electron Microscopy Principles and Fundamentals Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include:

• Stationary Beam Methods: Transmission Electron Microscoy/Electron Energy Loss Spectroscopy/Convergent Electron Beam Diffraction/Low Energy Electron Microscopy/Electron Holographic Methods
• Scanning Beam Methods: Scanning Transmission Electron Microscopy/Scanning Auger and XPS Microscopy/Scanning Microanalysis/Imaging Secondary Ion Mass Spectrometry
• Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/Spin Polarized Low Energy Electron Microscopy

Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.

Details zur Ausgabe

• Verlag: Wiley-VCH Verlag GmbH
• Erscheinungsdatum: 1997
• ISBN 10: 3527294791
• ISBN 13: 9783527294794
• Einband: Tapa dura
• Sprache: Englisch
• Anzahl der Seiten: 527
• Herausgeber: Amelinckx S.
• Kontakt zum Hersteller: Nicht verfügbar