Electromigration: Studied with the Optical Microscopy Imaging Method - Softcover

Li, Linghong

Softcover

ISBN 10: 3639088131 ISBN 13: 9783639088137

Verlag: VDM Verlag Dr. Müller, 2008

Inhaltsangabe

Electromigration is a microscopic phenomenoninvolving electric field-induced diffusion, which isvery relevant to damage in interconnections. Acommon method for monitoring interconnectiondegradation is through electrical resistancemeasurements, which requires direct electricalcontact. It is desirable to develop non-contactmethods to monitor electromigration damageformation. In this thesis, we propose a novelOptical Microscopy Imaging Method (OMIM), and weprovide a theoretical description and experimentalresults. OMIM not only provides a new method forstudying electromigration, but also provides auseful method for studying other micro-devices andmaterials in a non- contact mode.

Details zur Ausgabe

• Verlag: VDM Verlag Dr. Müller
• Erscheinungsdatum: 2008
• Sprache: Englisch
• ISBN 10: 3639088131
• ISBN 13: 9783639088137
• Einband: Taschenbuch
• Anzahl der Seiten: 76
• Kontakt zum Hersteller: Nicht verfügbar
• Verantwortliche Person: Zeitfracht Medien GmbH; info-medien@zeitfracht.de; ; Ferdinand-Jühlke-Straße 7; Erfurt; 99095; Deutschland