Data mining for degradation modelling - Softcover

Lin, Hungyen

Softcover

ISBN 10: 3639100786 ISBN 13: 9783639100785

Verlag: VDM Verlag Dr. Müller, 2008

Inhaltsangabe

Accelerated degradation testing is widely accepted in competitive industries. As there is no longer the need to test till failures, there are tremendous cost and time benefits on fully capitalizing on such a testing regime. Consequently, this research has aimed for better understanding of the relationship between design and degradation using the degradation data. Artificial neural network is widely used for complex problems in the literature. This book proposes and demonstrates the neural network modelling methodology into capturing the non parametric relationship between design and degradation, specific to the particular problem domain. In particular, two models of different practical significance are developed and compiled as Windows executables for predicting material performances.

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Über die Autorin bzw. den Autor

Hungyen Lin received B.Comp Sys. Eng. (Honors) from The University of Adelaide in 2003 and the M.S. degree from UniSA in 2005. He is currently working towards a Ph.D. degree in Electrical & Electronic Engineering at The University of Adelaide on an APA scholarship. His current research involves THz near-field imaging and signal processing.

Details zur Ausgabe

• Verlag: VDM Verlag Dr. Müller
• Erscheinungsdatum: 2008
• Sprache: Englisch
• ISBN 10: 3639100786
• ISBN 13: 9783639100785
• Einband: Taschenbuch
• Anzahl der Seiten: 124
• Kontakt zum Hersteller: Nicht verfügbar
• Verantwortliche Person: Zeitfracht Medien GmbH; info-medien@zeitfracht.de; ; Ferdinand-Jühlke-Straße 7; Erfurt; 99095; Deutschland