Modeling and Multiresolution Characterization of Micro/nano Surface: for Polymer Thin Films and Interfaces - Softcover

Mukherjee, Rajib; A Romagnoli, Jose

 
9783639266122: Modeling and Multiresolution Characterization of Micro/nano Surface: for Polymer Thin Films and Interfaces
Softcover
ISBN 10: 3639266129 ISBN 13: 9783639266122
Verlag: VDM Verlag Dr. Müller, 2010

Inhaltsangabe

Various statistical features can be used to characterize the surface in quantitative way. Such an analysis can be done by the multi-resolution capabilities of wavelet transforms (WT) of the surface microscopic image. A multi-scale molecular model can help to investigate the physical and chemical mechanism in manufacturing process. Multiresolution characterization can be performed on the model structure to compare with image analysis. In this book, we have used a soft polymeric surface and applied multiresolution characterization for surface feature extraction and multiscale modeling for optimizing system variables to get desired surface characteristics. In microfabrication, the efficiency of the product reduced by line-edge roughness (LER). Off-line LER characterization is usually based on the top-down SEM image. This book shows wavelet based segmentation method for edge searching region as well as wavelet based characterization. For mesoscale modeling, the Flory-Huggins interaction parameters of the clusters of atoms or molecules are used. We have identified the phase separation by spinodal decomposition resulting in the formation of LER on polymer surface.

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Reseña del editor

Various statistical features can be used to characterize the surface in quantitative way. Such an analysis can be done by the multi-resolution capabilities of wavelet transforms (WT) of the surface microscopic image. A multi-scale molecular model can help to investigate the physical and chemical mechanism in manufacturing process. Multiresolution characterization can be performed on the model structure to compare with image analysis. In this book, we have used a soft polymeric surface and applied multiresolution characterization for surface feature extraction and multiscale modeling for optimizing system variables to get desired surface characteristics. In microfabrication, the efficiency of the product reduced by line-edge roughness (LER). Off-line LER characterization is usually based on the top-down SEM image. This book shows wavelet based segmentation method for edge searching region as well as wavelet based characterization. For mesoscale modeling, the Flory-Huggins interaction parameters of the clusters of atoms or molecules are used. We have identified the phase separation by spinodal decomposition resulting in the formation of LER on polymer surface.

Biografía del autor

Rajib Mukherjee: BTech (AU College of Eng.), 1997 and MTech (IIT Kanpur), India, 1999 both in chemical engineering. He also earned MS (2008) and PhD (2010) from the Dept. of Chem. Eng. at LSU. At present he is post doctoral researcher at the Center for Computational Science, Tulale University. Dr. Jose A Romagnoli: professor of Chem. Eng. (LSU).

Rajib Mukherjee: BTech (AU College of Eng.), 1997 and MTech (IIT Kanpur), India, 1999 both in chemical engineering. He also earned MS (2008) and PhD (2010) from the Dept. of Chem. Eng. at LSU. At present he is post doctoral researcher at the Center for Computational Science, Tulale University. Dr. Jose A Romagnoli: professor of Chem. Eng. (LSU).

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Verlag
VDM Verlag Dr. Müller
Erscheinungsdatum
2010
Sprache
Englisch
ISBN 10 
3639266129
ISBN 13 
9783639266122
Einband
Tapa blanda
Anzahl der Seiten
124
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
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