This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.
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Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. 500 pp. Englisch. Bestandsnummer des Verkäufers 9783642056024
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Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing the state-of-the-art of this techniqueReal industrial applications includedExamining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely an. Bestandsnummer des Verkäufers 5044737
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Taschenbuch. Zustand: Neu. Applied Scanning Probe Methods I | Bharat Bhushan (u. a.) | Taschenbuch | NanoScience and Technology | Englisch | 2010 | Springer | EAN 9783642056024 | Verantwortliche Person für die EU: Springer Heidelberg, Tiergartenstr. 17, 69121 Heidelberg, buchhandel-buch[at]springer[dot]com | Anbieter: preigu. Bestandsnummer des Verkäufers 107174669
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Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 500 pp. Englisch. Bestandsnummer des Verkäufers 9783642056024
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This volume examines the physical and technical foundation for recent progress in appliednear-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book. Bestandsnummer des Verkäufers 9783642056024
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