Atomic and Nuclear Analytical Methods: XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques - Softcover

Verma, Hem Raj R.

Softcover

ISBN 10: 3642067735 ISBN 13: 9783642067730

Verlag: Springer, 2010

Inhaltsangabe

This book is a blend of analytical methods based on the phenomenon of atomic and nuclear physics. It comprises comprehensive presentations of nine analytical techniques important in material science and many other branches of science. These techniques are commonly applied in the fields of medicine, biology, environmental studies, archaeology or geology et al. and pursued in major international research laboratories. The book’s clarity of presentation helps to deliver better understanding for students and researchers.

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This book is a blend of analytical methods based on the phenomenon of atomic and nuclear physics. It comprises comprehensive presentations about X-ray Fluorescence (XRF), Mössbauer Spectroscopy (MS), X-ray Photoelectron Spectroscopy (XPS), Neutron- Activation Analysis (NAA), Particle Induced X-ray Emission Analysis (PIXE), Rutherford Backscattering Analysis (RBS), Elastic Recoil Detection (ERD), Nuclear Reaction Analysis (NRA), Particle Induced Gamma-ray Emission Analysis (PIGE), and Accelerator Mass Spectrometry (AMS). These techniques are commonly applied in the fields of medicine, biology, environmental studies, archaeology or geology et al. and pursued in major international research laboratories.

Details zur Ausgabe

• Verlag: Springer
• Erscheinungsdatum: 2010
• Sprache: Englisch
• ISBN 10: 3642067735
• ISBN 13: 9783642067730
• Einband: Taschenbuch
• Anzahl der Seiten: 392
• Kontakt zum Hersteller: Dt. Universitätsverlag; buchhandel-buch@springer.com; ; Abraham-Lincoln-Str. 46; Wiesbaden; 65198; Deutschland