High-Resolution Imaging and Spectrometry of Materials: 50 (Springer Series in Materials Science) - Softcover
Inhaltsangabe
This book is an advanced text on high-resolution electron microscopy. It gives a survey of high-level electron microscopy and its application to surface and interface studies.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Von der hinteren Coverseite
This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
Weitere beliebte Ausgaben desselben Titels
Suchergebnisse für High-Resolution Imaging and Spectrometry of Materials:...
Foto des Verkäufers
High-Resolution Imaging and Spectrometry of Materials
Verlag:
Springer Berlin Heidelberg Dez 2010, 2010
ISBN 10: 3642075258
ISBN 13: 9783642075254
Neu
Taschenbuch
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. 456 pp. Englisch. Bestandsnummer des Verkäufers 9783642075254
Neu kaufen
EUR 160,49
Versand:
EUR 23,00
Von Deutschland nach USA
Anzahl: 2 verfügbar
Foto des Verkäufers
High-Resolution Imaging and Spectrometry of Materials
Print-on-DemandAnbieter: moluna, Greven, Deutschland
Verkäuferbewertung 4 von 5 Sternen
Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. In contrast to previously available books this not only reports on the state of the art of advanced electron microscopy but also contains examples of applicationsThe characterisation of materials and material systems is an essential aspect of materials . Bestandsnummer des Verkäufers 5046592
Neu kaufen
EUR 136,16
Versand:
EUR 48,99
Von Deutschland nach USA
Anzahl: Mehr als 20 verfügbar
Beispielbild für diese ISBN
High-Resolution Imaging and Spectrometry of Materials
Anbieter: Books Puddle, New York, NY, USA
Verkäuferbewertung 4 von 5 Sternen
Zustand: New. pp. xiv + 440. Bestandsnummer des Verkäufers 2614416147
Foto des Verkäufers
High-Resolution Imaging and Spectrometry of Materials
Anbieter: preigu, Osnabrück, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. High-Resolution Imaging and Spectrometry of Materials | Manfred Rühle (u. a.) | Taschenbuch | xiv | Englisch | 2010 | Springer | EAN 9783642075254 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. Bestandsnummer des Verkäufers 107174663
Neu kaufen
EUR 141,30
Versand:
EUR 70,00
Von Deutschland nach USA
Anzahl: 5 verfügbar
Foto des Verkäufers
High-Resolution Imaging and Spectrometry of Materials
ISBN 10: 3642075258
ISBN 13: 9783642075254
Neu
Taschenbuch
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 456 pp. Englisch. Bestandsnummer des Verkäufers 9783642075254
Neu kaufen
EUR 160,49
Versand:
EUR 60,00
Von Deutschland nach USA
Anzahl: 1 verfügbar
Foto des Verkäufers
High-Resolution Imaging and Spectrometry of Materials
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. Bestandsnummer des Verkäufers 9783642075254
Neu kaufen
EUR 160,49
Versand:
EUR 63,43
Von Deutschland nach USA
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
High-Resolution Imaging and Spectrometry of Materials
Print-on-DemandAnbieter: Majestic Books, Hounslow, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
Zustand: New. Print on Demand pp. xiv + 440 211 Illus. (32 Col.). Bestandsnummer des Verkäufers 11290316
Neu kaufen
EUR 222,04
Versand:
EUR 7,44
Von Vereinigtes Königreich nach USA
Anzahl: 4 verfügbar
Beispielbild für diese ISBN
High-Resolution Imaging and Spectrometry of Materials
Print-on-DemandAnbieter: Biblios, Frankfurt am main, HESSE, Deutschland
Verkäuferbewertung 4 von 5 Sternen
Zustand: New. PRINT ON DEMAND pp. xiv + 440. Bestandsnummer des Verkäufers 1814416153
Neu kaufen
EUR 222,67
Versand:
EUR 9,95
Von Deutschland nach USA
Anzahl: 4 verfügbar
Beispielbild für diese ISBN
High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science)
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
Paperback. Zustand: Brand New. reprint edition. 454 pages. 9.00x6.00x1.08 inches. In Stock. Bestandsnummer des Verkäufers 3642075258
Neu kaufen
EUR 243,05
Versand:
EUR 14,31
Von Vereinigtes Königreich nach USA
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science, 50)
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
Paperback. Zustand: Like New. Like New. book. Bestandsnummer des Verkäufers ERICA79036420752586
Gebraucht kaufen
EUR 238,18
Versand:
EUR 28,62
Von Vereinigtes Königreich nach USA
Anzahl: 1 verfügbar