Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, Band 45) - Softcover

Reimer, Ludwig

Softcover

ISBN 10: 3642083722 ISBN 13: 9783642083723

Verlag: Springer, 2010

Inhaltsangabe

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interations. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Details zur Ausgabe

• Verlag: Springer
• Erscheinungsdatum: 2010
• Sprache: Englisch
• ISBN 10: 3642083722
• ISBN 13: 9783642083723
• Einband: Taschenbuch
• Auflage: 2
• Anzahl der Seiten: 544
• Herausgeber: Hawkes P.W.
• Kontakt zum Hersteller: ProductSafety@springernature.com; ProductSafety@springernature.com; ; Poststr. 9; Darmstadt; 64293; Deutschland