Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences, 48, Band 48) - Hardcover

Hardcover

ISBN 10: 3642225659 ISBN 13: 9783642225659

Verlag: Springer, 2011

Inhaltsangabe

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

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In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

Details zur Ausgabe

• Verlag: Springer
• Erscheinungsdatum: 2011
• Sprache: Englisch
• ISBN 10: 3642225659
• ISBN 13: 9783642225659
• Einband: Gebundene Ausgabe
• Anzahl der Seiten: 348
• Herausgeber: Sadewasser Sascha, Glatzel Thilo
• Kontakt zum Hersteller: Springer Nature Customer Service Center GmbH; ProductSafety@springernature.com; ; Europaplatz 3; Heidelberg; 69115; Deutschland