Verwandte Artikel zu Improving Reliability of Tungsten Plug Via on an Integrated...

Improving Reliability of Tungsten Plug Via on an Integrated Circuitry: Process Flow in BiCMOS and CMOS technology with Failure Analysis,Design of Experiments,Statistical Analysis & Wafer Maps - Softcover

Mulay, Apek

 
9783659947483: Improving Reliability of Tungsten Plug Via on an Integrated Circuitry: Process Flow in BiCMOS and CMOS technology with Failure Analysis,Design of Experiments,Statistical Analysis & Wafer Maps
Softcover
ISBN 10: 3659947482 ISBN 13: 9783659947483
Verlag: LAP LAMBERT Academic Publishing, 2016

Inhaltsangabe

The failure of an electronic circuitry with Aluminum metal process due to electromigration degradation has been a continuous process of research and development in semiconductor industry. With the advent of Internet of Things (IoT) revolution in global semiconductor industry, there is an expected huge demand for analog ICs for healthcare, automotive and other consumer electronic applications. Analog ICs make use of Aluminum metal process as most of the analog applications do not need a state-of-the-art technology. Aluminum is not only cost effective in use but also easy to use in processing as compared to copper. However, Aluminum metal process is prone to electromigration failures. Hence, Electronic chips that make use of Aluminum metal process have to undergo rigorous tests for reliability related failures. When wafer yield becomes low due to electromigration related failures, it results into a huge loss for the semiconductor foundries because of the capital intensive nature of this business. Hence, Semiconductor Industry Professional should be equipped with detail process steps in order to improve the process yield including statistical analysis with Design of Experiments (DoE).

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.

Über die Autorin bzw. den Autor

Apek Mulay is author Mass Capitalism: A Blueprint for Economic Revival (2014), Sustaining Moore¿s Law: Uncertainty Leading to a Certainty of IoT Revolution (2015) & How the Information Revolution remade Business, and the Economy: A Roadmap for Progress of the Semiconductor Industry (2016). Apek has very well visited personal blog www.ApekMulay.com

„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.

Verlag
LAP LAMBERT Academic Publishing
Erscheinungsdatum
2016
Sprache
Englisch
ISBN 10 
3659947482
ISBN 13 
9783659947483
Einband
Taschenbuch
Anzahl der Seiten
168
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
KreGa Onlinehandel GmbH
4950000000000
info@krega-onlinehandel.de

Birkenweg 31
Brakel
33034
Deutschland