Surface Analysis Methods in Materials Science - Softcover

Softcover

ISBN 10: 3662052288 ISBN 13: 9783662052280

Verlag: Springer, 2014

Inhaltsangabe

I Introduction.- 1 Solid Surfaces, Their Structure and Composition.- 2 UHV Basics.- II Techniques.- 3 Electron Microscope Techniques for Surface Characterization.- 4 Sputter Depth Profiling.- 5 SIMS - Secondary Ion Mass Spectrometry.- 6 Auger Electron Spectroscopy and Microscopy - Techniques and Applications.- 7 X-Ray Photoelectron Spectroscopy.- 8 Vibrational Spectroscopy of Surfaces.- 9 Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis.- 10 Materials Characterization by Scanned Probe Analysis.- 11 Low Energy Ion Scattering.- 12 Reflection High Energy Electron Diffraction.- 13 Low Energy Electron Diffraction.- 14 Ultraviolet Photoelectron Spectroscopy of Solids.- 15 EXAFS.- III Processes and Applications.- 16 Minerals, Ceramics and Glasses.- 17 Characterization of Catalysts by Surface Analysis.- 18 Application to Semiconductor Devices.- 19 Characterisation of Oxidised Surfaces.- 20 Coated Steel.- 21 Thin Film Analysis.- 22 Identification of Adsorbed Species.- 23 Surface Analysis of Polymers.- 24 Glow Discharge Optical Emission Spectrometry.- IV Appendix.- Acronyms Used in Surface and Thin Film Analysis.- Surface Science Bibliography.

Details zur Ausgabe

• Verlag: Springer
• Erscheinungsdatum: 2014
• Sprache: Englisch
• ISBN 10: 3662052288
• ISBN 13: 9783662052280
• Einband: Taschenbuch
• Anzahl der Seiten: 616
• Herausgeber: O'Connor John, Sexton Brett, Smart Roger
• Kontakt zum Hersteller: ROXIO; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; 22391; Deutschland