Verwandte Artikel zu Diffraction Analysis of the Microstructure of Materials

Diffraction Analysis of the Microstructure of Materials - Softcover

 
9783662067246: Diffraction Analysis of the Microstructure of Materials

Zu dieser ISBN ist aktuell kein Angebot verfügbar.

Inhaltsangabe

1 Line Profile Analysis: A Historical Overview.- 2 Convolution Based Profile Fitting.- 3 Whole Powder Pattern Modelling: Theory and Applications.- 4 Full Profile Analysis of X-ray Diffraction Patterns for Investigation of Nanocrystalline Systems.- 5 Crystallite Size and Residual Strain/Stress Modeling in Rietveld Refinement.- 6 The Quantitative Determination of the Crystalline and the Amorphous Content by the Rietveld Method: Application to Glass Ceramics with Different Absorption Coefficients.- 7 Quantitative Analysis of Amorphous Fraction in the Study of the Microstructure of Semi-crystalline Materials.- 8 A Bayesian/Maximum Entropy Method for the Certification of a Nanocrystallite-Size NIST Standard Reference Material.- 9 Study of Submicrocrystalline Materials by Diffuse Scattering in Transmitted Wave.- 10 Determining the Dislocation Contrast Factor for X-ray Line Profile Analysis.- 11 X-ray Peak Broadening Due to Inhomogeneous Dislocation Distributions.- 12 Determination of Non-uniform Dislocation Distributions in Polycrystalline Materials.- 13 Line Profile Fitting: The Case of fcc Crystals Containing Stacking Faults.- 14 Diffraction Elastic Constants and Stress Factors; Grain Interaction and Stress in Macroscopically Elastically Anisotropic Solids; The Case of Thin Films.- 15 Interaction between Phases in Co-deforming Two-Phase Materials: The Role of Dislocation Arrangements.- 16 Grain Surface Relaxation Effects in Powder Diffraction.- 17 Interface Stress in Polycrystalline Materials.- 18 Problems Related to X-Ray Stress Analysis in Thin Films in the Presence of Gradients and Texture.- 19 Two-Dimensional XRD Profile Modelling in Imperfect Epitaxial Layers.- 20 Three-Dimensional Reciprocal Space Mapping: Application to Polycrystalline CVD Diamond.

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.

(Keine Angebote verfügbar)

Buch Finden:



Kaufgesuch aufgeben

Sie finden Ihr gewünschtes Buch nicht? Wir suchen weiter für Sie. Sobald einer unserer Buchverkäufer das Buch bei AbeBooks anbietet, werden wir Sie informieren!

Kaufgesuch aufgeben

Weitere beliebte Ausgaben desselben Titels

9783540405191: Diffraction Analysis of the Microstructure of Materials: 68 (Springer Series in Materials Science)

Vorgestellte Ausgabe

ISBN 10:  3540405194 ISBN 13:  9783540405191
Verlag: Springer, 2003
Hardcover