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Radiation Harden devices and Circuits for Analog Application: Devices and Circuits for Analog and RF application under extreme environment - Softcover
Inhaltsangabe
Reliability of Operating Electronic equipments on board of artificial satellites, spacecrafts, and military aircraft's in extreme environment require radiation hardening. The effects of radiation, both single event and total ionization dose on the phase frequency detector, voltage controlled oscillator, charge pump and filters for PLL application are studied. The focus is on and CMOS based technologies; however, other high performance technologies will be discussed wherever appropriate. The points of concern are single event effects (SEE) and steady state total ionizing dose (TID) IC response. Specific design architecture and techniques are implemented including radiation effects, radiation hardening technique, PLL building blocks and the overall performance to help mitigate radiation effects that degrade PLL performance. This book aims towards the design and analysis of a radiation hardening of all individual components of Rad-hard PLL starting from process simulation and device simulation to Circuit simulation using 0.5um CMOS library.
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Reseña del editor
Reliability of Operating Electronic equipments on board of artificial satellites, spacecrafts, and military aircraft's in extreme environment require radiation hardening. The effects of radiation, both single event and total ionization dose on the phase frequency detector, voltage controlled oscillator, charge pump and filters for PLL application are studied. The focus is on and CMOS based technologies; however, other high performance technologies will be discussed wherever appropriate. The points of concern are single event effects (SEE) and steady state total ionizing dose (TID) IC response. Specific design architecture and techniques are implemented including radiation effects, radiation hardening technique, PLL building blocks and the overall performance to help mitigate radiation effects that degrade PLL performance. This book aims towards the design and analysis of a radiation hardening of all individual components of Rad-hard PLL starting from process simulation and device simulation to Circuit simulation using 0.5um CMOS library.
Biografía del autor
Chandra Prakash Jain Obtained B.E, M.Tech and pursuing PhD in VLSI Design. He worked in Instrumentation Limited, Kota for 2 years. Presently he is Sr. Assistant Professor in Electronics department at Banasthali University and Involved in teaching and research for last 9 years. his area of Interest is Devices and circuits under extreme environment.
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Radiation Harden devices and Circuits for Analog Application
Verlag:
LAP LAMBERT Academic Publishing, 2011
ISBN 10: 3845432020
ISBN 13: 9783845432021
Neu
Softcover
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Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Jain Chandra PrakashChandra Prakash Jain Obtained B.E, M.Tech and pursuing PhD in VLSI Design. He worked in Instrumentation Limited, Kota for 2 years. Presently he is Sr. Assistant Professor in Electronics department at Banasthali Un. Bestandsnummer des Verkäufers 5482223
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Radiation Harden devices and Circuits for Analog Application
Verlag:
LAP LAMBERT Academic Publishing Sep 2011, 2011
ISBN 10: 3845432020
ISBN 13: 9783845432021
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Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
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Taschenbuch. Zustand: Neu. Neuware -Reliability of Operating Electronic equipments on board of artificial satellites, spacecrafts, and military aircraft's in extreme environment require radiation hardening. The effects of radiation, both single event and total ionization dose on the phase frequency detector, voltage controlled oscillator, charge pump and filters for PLL application are studied. The focus is on and CMOS based technologies; however, other high performance technologies will be discussed wherever appropriate. The points of concern are single event effects (SEE) and steady state total ionizing dose (TID) IC response. Specific design architecture and techniques are implemented including radiation effects, radiation hardening technique, PLL building blocks and the overall performance to help mitigate radiation effects that degrade PLL performance. This book aims towards the design and analysis of a radiation hardening of all individual components of Rad-hard PLL starting from process simulation and device simulation to Circuit simulation using 0.5um CMOS library.Books on Demand GmbH, Überseering 33, 22297 Hamburg 96 pp. Englisch. Bestandsnummer des Verkäufers 9783845432021
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Radiation Harden devices and Circuits for Analog Application : Devices and Circuits for Analog and RF application under extreme environment
Verlag:
LAP LAMBERT Academic Publishing, 2011
ISBN 10: 3845432020
ISBN 13: 9783845432021
Neu
Taschenbuch
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
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Taschenbuch. Zustand: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Reliability of Operating Electronic equipments on board of artificial satellites, spacecrafts, and military aircraft's in extreme environment require radiation hardening. The effects of radiation, both single event and total ionization dose on the phase frequency detector, voltage controlled oscillator, charge pump and filters for PLL application are studied. The focus is on and CMOS based technologies; however, other high performance technologies will be discussed wherever appropriate. The points of concern are single event effects (SEE) and steady state total ionizing dose (TID) IC response. Specific design architecture and techniques are implemented including radiation effects, radiation hardening technique, PLL building blocks and the overall performance to help mitigate radiation effects that degrade PLL performance. This book aims towards the design and analysis of a radiation hardening of all individual components of Rad-hard PLL starting from process simulation and device simulation to Circuit simulation using 0.5um CMOS library. Bestandsnummer des Verkäufers 9783845432021
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Radiation Harden devices and Circuits for Analog Application
Verlag:
LAP LAMBERT Academic Publishing Sep 2011, 2011
ISBN 10: 3845432020
ISBN 13: 9783845432021
Neu
Taschenbuch
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
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Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Reliability of Operating Electronic equipments on board of artificial satellites, spacecrafts, and military aircraft's in extreme environment require radiation hardening. The effects of radiation, both single event and total ionization dose on the phase frequency detector, voltage controlled oscillator, charge pump and filters for PLL application are studied. The focus is on and CMOS based technologies; however, other high performance technologies will be discussed wherever appropriate. The points of concern are single event effects (SEE) and steady state total ionizing dose (TID) IC response. Specific design architecture and techniques are implemented including radiation effects, radiation hardening technique, PLL building blocks and the overall performance to help mitigate radiation effects that degrade PLL performance. This book aims towards the design and analysis of a radiation hardening of all individual components of Rad-hard PLL starting from process simulation and device simulation to Circuit simulation using 0.5um CMOS library. 96 pp. Englisch. Bestandsnummer des Verkäufers 9783845432021
Anzahl: 2 verfügbar
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Radiation Harden devices and Circuits for Analog Application: Devices and Circuits for Analog and RF application under extreme environment
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LAP LAMBERT Academic Publishing, 2011
ISBN 10: 3845432020
ISBN 13: 9783845432021
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Radiation Harden devices and Circuits for Analog Application: Devices and Circuits for Analog and RF application under extreme environment
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LAP LAMBERT Academic Publishing, 2011
ISBN 10: 3845432020
ISBN 13: 9783845432021
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Radiation Harden devices and Circuits for Analog Application: Devices and Circuits for Analog and RF application under extreme environment
Verlag:
LAP LAMBERT Academic Publishing, 2011
ISBN 10: 3845432020
ISBN 13: 9783845432021
Neu
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