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Statistical Circuit Simulations: From ‘Atomistic’ Compact Models to Statistical Standard Cell Characterisation - Softcover

Kamsani, Noor Ain

 
9783847344131: Statistical Circuit Simulations: From ‘Atomistic’ Compact Models to Statistical Standard Cell Characterisation
Softcover
ISBN 10: 3847344137 ISBN 13: 9783847344131
Verlag: LAP LAMBERT Academic Publishing, 2012

Inhaltsangabe

This work describes the development and application of statistical circuit simulation methodologies to analyse digital circuits subject to intrinsic parameter fluctuations. The specific nature of intrinsic parameter fluctuations are discussed, and the crucial importance to the semiconductor industry of developing design tools which accurately account for their effects are explained. Current work in the area is reviewed, and three important factors are made clear: any statistical circuit simulation methodology must be based on physically correct, predictive models of device variability; the statistical compact models describing device operation must be characterised for accurate transient analysis of circuits; analysis must be carried out on realistic circuit components.

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Verlag
LAP LAMBERT Academic Publishing
Erscheinungsdatum
2012
Sprache
Englisch
ISBN 10 
3847344137
ISBN 13 
9783847344131
Einband
Taschenbuch
Anzahl der Seiten
204
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
Verlag Unser Wissen
customerservice@vdm-vsg.de

Brivibas gatve 197
Riga
1039
Lettland