High-Resolution Electron Microscopy for Materials Science - Softcover

Shindo, Daisuke

Softcover

ISBN 10: 4431702342 ISBN 13: 9784431702344

Verlag: Springer, 2013

Inhaltsangabe

High-resolution electron microscopy (H.R.E.M.) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of H.R.E.M. for materials science.

Über diesen Titel

Über die Autorin bzw. den Autor

Daisuke Shindo received his Dr. Eng. from Tohoku University in 1982. He is Professor Emeritus in Tohoku University and Team Leader in RIKEN Center for Emergent Matter Science. He is Fellow of the Japan Institute of Metals and Materials and Fellow of Korean Society of Microscopy. He has been involved in electron microscopy for more than 30 years. He is Author of books "High-Resolution Electron Microscopy for Materials Science" and "Analytical Electron Microscopy for Materials Science." He is currently interested in electromagnetic-field observation by electron holography, in particular, in electron holographic observation of collective motions of electrons. Zentaro Akase received his Dr. Eng. from Kyushu University in 2001. He is Senior Assistant Professor in the Institute of Multidisciplinary Research for Advanced Materials, Tohoku University. His current research activities include the development of in-situ Lorentz microscopy with alternating magnetic fields and analysis of effects of dynamical electron diffraction on phase shift detected by electron holography. In-situ observation with electron holography is his main current research interest.

Details zur Ausgabe

• Verlag: Springer
• Erscheinungsdatum: 2013
• Sprache: Englisch
• ISBN 10: 4431702342
• ISBN 13: 9784431702344
• Einband: Taschenbuch
• Anzahl der Seiten: 204
• Kontakt zum Hersteller: Springer Nature Customer Service Center GmbH; ProductSafety@springernature.com; ; Europaplatz 3; Heidelberg; 69115; Deutschland