Space Radiation Monitoring Instrumentation - Softcover

Mahant, Keyur ; Mewada, Hiren ; Patel, Amit

9786136718255: Space Radiation Monitoring Instrumentation

Softcover

ISBN 10: 6136718251 ISBN 13: 9786136718255

Verlag: LAP LAMBERT Academic Publishing, 2018

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The charged particles can cause adverse effects on spacecraft and electronics components. Radiation effects from high energy particles cause spacecraft surface charging, degradation or permanent failure of the electronic components and sub systems by single event effects, displacement damages and ionizing dose effects in the spacecraft. The effects of ion-induced charge transients can be divided in the basic three categories: Total ionizing dose (TID), linear energy transfer (LET) and Single event upset (SEU).TID effect is accumulation of ionizing energy deposited over a long period on semiconductor materials. TID occurs mostly due to the electrons and protons, which can cause failure of device. The total energy loss or transfer to the material per unit distance of travel trough the material is called LET Electronic devices can be disturbed by the passage of energetic electrons, protons or heavier ions that may alter the state of a circuit, producing "single event effects". SEU and multiple-bit upset (MBU) which change the logic state of internal nodes of the circuit. It can be reset by different electrical operations. These errors are called soft errors which are recoverable.

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�ber die Autorin bzw. den Autor

Keyur Mahant naci� en Cambay, India, el 2 de agosto de 1986. Se licenci� en Electr�nica y Comunicaci�n en el C U Shah College of Engineering and Technology, India, en 2008. Tambi�n obtuvo un m�ster en sistemas de comunicaci�n en la Universidad de CHARUSAT, India, en 2011. Actualmente, est� realizando su doctorado en el campo de la RF y las microondas.

��ber diesen Titel� kann sich auf eine andere Ausgabe dieses Titels beziehen.

Verlag: LAP LAMBERT Academic Publishing
Erscheinungsdatum: 2018
Sprache: Englisch
ISBN 10: 6136718251
ISBN 13: 9786136718255
Einband: Taschenbuch
Anzahl der Seiten: 56
Kontakt zum Hersteller: Nicht verf�gbar
Verantwortliche Person: JustFiction Edition
customerservice@vdm-vsg.de

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Space Radiation Monitoring Instrumentation

Keyur Mahant

Verlag: LAP LAMBERT Academic Publishing Jan 2018, 2018

ISBN 10: 6136718251 ISBN 13: 9786136718255

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Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The charged particles can cause adverse effects on spacecraft and electronics components. Radiation effects from high energy particles cause spacecraft surface charging, degradation or permanent failure of the electronic components and sub systems by single event effects, displacement damages and ionizing dose effects in the spacecraft. The effects of ion-induced charge transients can be divided in the basic three categories: Total ionizing dose (TID), linear energy transfer (LET) and Single event upset (SEU).TID effect is accumulation of ionizing energy deposited over a long period on semiconductor materials. TID occurs mostly due to the electrons and protons, which can cause failure of device. The total energy loss or transfer to the material per unit distance of travel trough the material is called LET Electronic devices can be disturbed by the passage of energetic electrons, protons or heavier ions that may alter the state of a circuit, producing 'single event effects'. SEU and multiple-bit upset (MBU) which change the logic state of internal nodes of the circuit. It can be reset by different electrical operations. These errors are called soft errors which are recoverable. 56 pp. Englisch. Bestandsnummer des Verk�ufers 9786136718255

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Space Radiation Monitoring Instrumentation

Mahant, Keyur/ Mewada, Hiren/ Patel, Amit

Verlag: LAP LAMBERT Academic Publishing, 2018

ISBN 10: 6136718251 ISBN 13: 9786136718255

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Paperback. Zustand: Brand New. 56 pages. 8.66x5.91x0.13 inches. In Stock. Bestandsnummer des Verk�ufers zk6136718251

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Space Radiation Monitoring Instrumentation

Keyur Mahant

Verlag: LAP LAMBERT Academic Publishing Jan 2018, 2018

ISBN 10: 6136718251 ISBN 13: 9786136718255

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Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The charged particles can cause adverse effects on spacecraft and electronics components. Radiation effects from high energy particles cause spacecraft surface charging, degradation or permanent failure of the electronic components and sub systems by single event effects, displacement damages and ionizing dose effects in the spacecraft. The effects of ion-induced charge transients can be divided in the basic three categories: Total ionizing dose (TID), linear energy transfer (LET) and Single event upset (SEU).TID effect is accumulation of ionizing energy deposited over a long period on semiconductor materials. TID occurs mostly due to the electrons and protons, which can cause failure of device. The total energy loss or transfer to the material per unit distance of travel trough the material is called LET Electronic devices can be disturbed by the passage of energetic electrons, protons or heavier ions that may alter the state of a circuit, producing 'single event effects'. SEU and multiple-bit upset (MBU) which change the logic state of internal nodes of the circuit. It can be reset by different electrical operations. These errors are called soft errors which are recoverable.VDM Verlag, Dudweiler Landstra�e 99, 66123 Saarbr�cken 56 pp. Englisch. Bestandsnummer des Verk�ufers 9786136718255

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Space Radiation Monitoring Instrumentation

Keyur Mahant

Verlag: LAP LAMBERT Academic Publishing, 2018

ISBN 10: 6136718251 ISBN 13: 9786136718255

Neu Taschenbuch

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Taschenbuch. Zustand: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The charged particles can cause adverse effects on spacecraft and electronics components. Radiation effects from high energy particles cause spacecraft surface charging, degradation or permanent failure of the electronic components and sub systems by single event effects, displacement damages and ionizing dose effects in the spacecraft. The effects of ion-induced charge transients can be divided in the basic three categories: Total ionizing dose (TID), linear energy transfer (LET) and Single event upset (SEU).TID effect is accumulation of ionizing energy deposited over a long period on semiconductor materials. TID occurs mostly due to the electrons and protons, which can cause failure of device. The total energy loss or transfer to the material per unit distance of travel trough the material is called LET Electronic devices can be disturbed by the passage of energetic electrons, protons or heavier ions that may alter the state of a circuit, producing 'single event effects'. SEU and multiple-bit upset (MBU) which change the logic state of internal nodes of the circuit. It can be reset by different electrical operations. These errors are called soft errors which are recoverable. Bestandsnummer des Verk�ufers 9786136718255

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