One of the challenges faced today in the design of microprocessors is to obtain energy efficiency, speed and reliability at the same time with technology scaling, in the face of extreme process variations. The variation in delay behavior of the same design within-die and die-to-die increases significantly at technology nodes below 10nm. In addition, timing variations during chip operation occur due to dynamically changing factors like workload, temperature, aging. To guarantee lifetime operational correctness under timing uncertainties, safety margins in the form of one-time worst-case guard-bands are incorporated into the design resulting in energy-speed inefficiencies. This book does literature survey of the digital design and micro-architectural techniques in literature to tackle the above challenges. Two methods are described in detail (1) A low cost post-manufacturing self-testing and speed-tuning methodology to top-up speed coverage and find the maximum reliable clock frequency of each processor pipeline in a multi-processor system (2) Design and operation of a novel timing variation tolerant pipeline design, which eliminates the need to incorporate timing safety margins.
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Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Natarajan JayaramJayaram Natarajan was born in Mumbai, India and received his BS in Electronics Engineering from University of Mumbai, MS and PhD in Electrical and Computer Engineering from Georgia Institute of Technology, Atlanta. H. Bestandsnummer des Verkäufers 335816032
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Taschenbuch. Zustand: Neu. Neuware -One of the challenges faced today in the design of microprocessors is to obtain energy efficiency, speed and reliability at the same time with technology scaling, in the face of extreme process variations. The variation in delay behavior of the same design within-die and die-to-die increases significantly at technology nodes below 10nm. In addition, timing variations during chip operation occur due to dynamically changing factors like workload, temperature, aging. To guarantee lifetime operational correctness under timing uncertainties, safety margins in the form of one-time worst-case guard-bands are incorporated into the design resulting in energy-speed inefficiencies. This book does literature survey of the digital design and micro-architectural techniques in literature to tackle the above challenges. Two methods are described in detail (1) A low cost post-manufacturing self-testing and speed-tuning methodology to top-up speed coverage and find the maximum reliable clock frequency of each processor pipeline in a multi-processor system (2) Design and operation of a novel timing variation tolerant pipeline design, which eliminates the need to incorporate timing safety margins.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 136 pp. Englisch. Bestandsnummer des Verkäufers 9786138916208
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Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -One of the challenges faced today in the design of microprocessors is to obtain energy efficiency, speed and reliability at the same time with technology scaling, in the face of extreme process variations. The variation in delay behavior of the same design within-die and die-to-die increases significantly at technology nodes below 10nm. In addition, timing variations during chip operation occur due to dynamically changing factors like workload, temperature, aging. To guarantee lifetime operational correctness under timing uncertainties, safety margins in the form of one-time worst-case guard-bands are incorporated into the design resulting in energy-speed inefficiencies. This book does literature survey of the digital design and micro-architectural techniques in literature to tackle the above challenges. Two methods are described in detail (1) A low cost post-manufacturing self-testing and speed-tuning methodology to top-up speed coverage and find the maximum reliable clock frequency of each processor pipeline in a multi-processor system (2) Design and operation of a novel timing variation tolerant pipeline design, which eliminates the need to incorporate timing safety margins. 136 pp. Englisch. Bestandsnummer des Verkäufers 9786138916208
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Taschenbuch. Zustand: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - One of the challenges faced today in the design of microprocessors is to obtain energy efficiency, speed and reliability at the same time with technology scaling, in the face of extreme process variations. The variation in delay behavior of the same design within-die and die-to-die increases significantly at technology nodes below 10nm. In addition, timing variations during chip operation occur due to dynamically changing factors like workload, temperature, aging. To guarantee lifetime operational correctness under timing uncertainties, safety margins in the form of one-time worst-case guard-bands are incorporated into the design resulting in energy-speed inefficiencies. This book does literature survey of the digital design and micro-architectural techniques in literature to tackle the above challenges. Two methods are described in detail (1) A low cost post-manufacturing self-testing and speed-tuning methodology to top-up speed coverage and find the maximum reliable clock frequency of each processor pipeline in a multi-processor system (2) Design and operation of a novel timing variation tolerant pipeline design, which eliminates the need to incorporate timing safety margins. Bestandsnummer des Verkäufers 9786138916208
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