Denoising in digital speckle pattern interferometry by Riesz wavelets - Softcover

Nassim, Abdelkrim; Tounsi, Yassine; Siari, Ahmed

Softcover

ISBN 10: 6139873827 ISBN 13: 9786139873821

Verlag: LAP LAMBERT Academic Publishing, 2018

Inhaltsangabe

Over the years, optical measurement techniques have been the problem-solving backbone of many engineering applications such as nondestructive testing of materials, measurement of various material properties, structural analysis, and experimental mechanics. Digital speckle pattern interferometry gives these measurements with high accuracy. The main challenges in speckle interferometry manifest on phase mapping estimation, leading to the direct determination of the measurement. Furthermore, fringes correlation are characterized by a strong speckle noise defined as a granular structure resulting from self-interference of coherent waves randomly scattered from a rough surface, making it capable of giving the measurement of physical magnitude with an accuracy of the order of wavelength used. For this reason, several papers are published annually in the speckle noise reduction domain.

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Über die Autorin bzw. den Autor

Abdelkrim Nassim, Ph.D. in physics from Chouaib Doukkali University, Morocco in collaboration with FIAM Laboratory, Catholic University of Louvain, Belgium. He has published several papers about digital speckle pattern interferometry in the two principal domains: speckle de-noising and speckle fringes correlation analysis.

Details zur Ausgabe

• Verlag: LAP LAMBERT Academic Publishing
• Erscheinungsdatum: 2018
• Sprache: Englisch
• ISBN 10: 6139873827
• ISBN 13: 9786139873821
• Einband: Taschenbuch
• Anzahl der Seiten: 56
• Kontakt zum Hersteller: Nicht verfügbar
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