X-ray fluorescence analysis techniques: Principles and instrumentations - Softcover

Ait Bouh, Hasna

Softcover

ISBN 10: 6202787716 ISBN 13: 9786202787710

Verlag: LAP LAMBERT Academic Publishing, 2020

Inhaltsangabe

X-ray fluorescence spectrometry is a physical technique of rapid elemental analysis. It makes it possible to determine the chemical composition, in major elements and in traces, for contents ranging from ppm up to 100%.Its operating principle consists of bombarding a sample with a flow of X photons of sufficient energy, then the emission of X-rays characteristic of the elements constituting the sample occurs, this is the phenomenon of X fluorescence. Analysis of these X-rays requires the presence of a dispersive system, one uses the phenomena of X-ray diffraction by crystals (Wavelength Dispersion X Fluorescence Spectrometer ,WD-XRF) and the other the sensitivity of certain sensors to the energy of the photons detected (Energy Dispersion X Fluorescence Spectrometer, ED-XRF). There is also another technique of Total Reflection X-Ray Fluorescence (TXRF) based on conventional energy dispersive X-ray fluorescence. X-ray fluorescence analysis covers several industries such as metallurgy, archeology, biology, petroleum products, etc. and is applied from boron to all elements of the Mendeleev table regardless of the nature of the sample.

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Über die Autorin bzw. den Autor

PhD in Physics from the Faculty of Sciences, Moulay Ismail University, Meknes-Morocco, researcher at the National Center for Energy, Nuclear Science and Technology (CNESTEN) Kenitra-Morocco.

Details zur Ausgabe

• Verlag: LAP LAMBERT Academic Publishing
• Erscheinungsdatum: 2020
• Sprache: Englisch
• ISBN 10: 6202787716
• ISBN 13: 9786202787710
• Einband: Taschenbuch
• Anzahl der Seiten: 52
• Kontakt zum Hersteller: Fromm; customerservice@vdm-vsg.de; ; Brivibas gatve 197; Riga; 1039; Lettland