Detecting Defects by Six Sigma Strategy: How to detect Manufacturing and Process Design Defects - Softcover

Jadhav, Parag; Bhavsar, Mikhil; Patil, Subhash

Softcover

ISBN 10: 6207451457 ISBN 13: 9786207451456

Verlag: LAP LAMBERT Academic Publishing, 2023

Inhaltsangabe

Lean Six Sigma is a system that is becoming more popular across all industries. Lean is a powerful concept for minimizing waste in processes, which reduces lead time and costs. While lean manufacturing focuses on producing more value with less effort, the Six Sigma system aims to identify and eliminate defects in product development. As a result, Lean Six Sigma provides a method for accelerating a company's decision-making processes while simultaneously reducing production inefficiencies and increasing product quality. Six Sigma is a powerful methodology that is based on statistical techniques and is used to eliminate variation in processes. Each strategy can benefit organizations. Significant training is required when adopting Lean Six Sigma to guarantee that the team is fully knowledgeable and has the appropriate resources. However, due to time constraints and the requirement to manage Lean Six Sigma projects, it is beneficial to generate fully supporting studies to ease education. These studies can be utilized throughout the course to reinforce ideas or as conceptual overviews.

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Über die Autorin bzw. den Autor

Herr Parag D. Jadhav - Spätes GN Sapkal College of Engineering, Nashik. (MH).Herr Mikhil K. Bhavsar - Industrieperson, Nashik. (MH)Herr Subhash S. Patil - Spätes GN Sapkal College für Ingenieurwesen, Nashik. (MH).

Details zur Ausgabe

• Verlag: LAP LAMBERT Academic Publishing
• Erscheinungsdatum: 2023
• Sprache: Englisch
• ISBN 10: 6207451457
• ISBN 13: 9786207451456
• Einband: Taschenbuch
• Anzahl der Seiten: 104
• Kontakt zum Hersteller: Nicht verfügbar
• Verantwortliche Person: Editions Muse; customerservice@vdm-vsg.de; ; Brivibas gatve 197; Riga; 1039; Lettland