Testing low power very large scale integrated (VLSI) circuits in the recent times has become a critical problem area due to yield and reliability problems. This research work lays emphasis on reducing power dissipation during test application at logic level and register-transfer level (RTL) of abstraction of the VLSI design flow. In the initial stage, this research work addresses power reduction techniques in scan sequential circuits at the logic level of abstraction. Implementation of a new best primary input change (BPIC) technique based on a novel test application strategy has been proposed. The technique increases the correlation between successive states during shifting in test vectors and shifting out test responses by changing the primary inputs such that the smallest number of transitions is achieved. The new technique is test set dependent and it is applicable to small to medium sized full and partial scan sequential circuits.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
1. B. Babu Rajesh: Research Scholar From Kanpur University, Kanpur U.P2. Dr. G. Manoj Someswar: Dean (R&D) Global Research Academy, Hyderabad, Telangana, India.3. Dr. V. Krishnanaik Ph.D(ECE): Professor, Brilliant Grammar School Educational Society group of Intuitions - Integrated Campus, Hyderabad.
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware 296 pp. Englisch. Bestandsnummer des Verkäufers 9786207460427
Anzahl: 2 verfügbar
Anbieter: Books Puddle, New York, NY, USA
Zustand: New. Bestandsnummer des Verkäufers 26403307157
Anzahl: 4 verfügbar
Anbieter: moluna, Greven, Deutschland
Kartoniert / Broschiert. Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Testing low power very large scale integrated (VLSI) circuits in the recent times has become a critical problem area due to yield and reliability problems. This research work lays emphasis on reducing power dissipation during test application at logic level. Bestandsnummer des Verkäufers 1476181643
Anzahl: Mehr als 20 verfügbar
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
Zustand: New. Print on Demand. Bestandsnummer des Verkäufers 410928458
Anzahl: 4 verfügbar
Anbieter: Biblios, Frankfurt am main, HESSE, Deutschland
Zustand: New. PRINT ON DEMAND. Bestandsnummer des Verkäufers 18403307167
Anzahl: 4 verfügbar
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Testing low power very large scale integrated (VLSI) circuits in the recent times has become a critical problem area due to yield and reliability problems. This research work lays emphasis on reducing power dissipation during test application at logic level and register-transfer level (RTL) of abstraction of the VLSI design flow. In the initial stage, this research work addresses power reduction techniques in scan sequential circuits at the logic level of abstraction. Implementation of a new best primary input change (BPIC) technique based on a novel test application strategy has been proposed. The technique increases the correlation between successive states during shifting in test vectors and shifting out test responses by changing the primary inputs such that the smallest number of transitions is achieved. The new technique is test set dependent and it is applicable to small to medium sized full and partial scan sequential circuits.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 296 pp. Englisch. Bestandsnummer des Verkäufers 9786207460427
Anzahl: 1 verfügbar
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Testing low power very large scale integrated (VLSI) circuits in the recent times has become a critical problem area due to yield and reliability problems. This research work lays emphasis on reducing power dissipation during test application at logic level and register-transfer level (RTL) of abstraction of the VLSI design flow. In the initial stage, this research work addresses power reduction techniques in scan sequential circuits at the logic level of abstraction. Implementation of a new best primary input change (BPIC) technique based on a novel test application strategy has been proposed. The technique increases the correlation between successive states during shifting in test vectors and shifting out test responses by changing the primary inputs such that the smallest number of transitions is achieved. The new technique is test set dependent and it is applicable to small to medium sized full and partial scan sequential circuits. Bestandsnummer des Verkäufers 9786207460427
Anzahl: 1 verfügbar