VLSI IMPLEMENTATION OF BUILT IN SELF-TEST: DE - Softcover

Fatima, M.; SAHU, SHUBHAM

 
9786207807802: VLSI IMPLEMENTATION OF BUILT IN SELF-TEST: DE
Softcover
ISBN 10: 6207807804 ISBN 13: 9786207807802
Verlag: LAP LAMBERT Academic Publishing, 2025

Inhaltsangabe

Built-in Self-Test (BIST) is a technique that integrates additional hardware and software into integrated circuits, enabling them to perform self-testing. A key component often used in BIST is the Linear Feedback Shift Register (LFSR), a shift register where the input bit is a linear function of its previous state.BIST is the standard method for testing embedded memories. Over time, memory BIST techniques have evolved to address the growing demands of advanced technologies and markets. BIST improves testing efficiency by allowing full-speed memory access and reducing manufacturing test time through rapid, on-chip pattern generation.This book focuses on implementing BIST using Verilog HDL on Xilinx ISE 14.7. It includes the design of an LFSR and an SRAM controller to support BIST, enhancing overall system performance.

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Über die Autorin bzw. den Autor

Dr M. Fatima is a professor in Artificial Intelligence and Machine Learning Department in Sagar Institute of Research and Technology, India. She has teaching experience of 27 years. Her area of research is Computer Network, VLSI and Antenna. Many Mtech students completed their dissertation work.

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Verlag
LAP LAMBERT Academic Publishing
Erscheinungsdatum
2025
Sprache
Englisch
ISBN 10 
6207807804
ISBN 13 
9786207807802
Einband
Taschenbuch
Anzahl der Seiten
64
Kontakt zum Hersteller
preigu GmbH & Co. KG
mail@preigu.de

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