This comprehensive book offers an in-depth exploration of the essential methodologies in single-crystal X-ray diffraction (SCXRD) and structural crystallography. It provides a clear, step-by-step pathway from the acquisition of raw diffraction data to the final validation of refined crystal structures. Beginning with the principles of data collection and reflection indexing, the book guides readers through the intricacies of data treatment, quality assessment, and symmetry determination. Special emphasis is placed on best practices for applying space-group analysis, refining atomic models, and ensuring the reliability of structural results.Designed to serve both as a teaching tool and a reference work, this volume is intended for graduate students, researchers, and professionals in crystallography, materials science, and molecular sciences.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Dr.-Ing. Hafid Zouihri is Professor of Materials Science at Moulay Ismail University, Morocco. His research focuses on perovskites, borophosphates, and advanced materials for environmental remediation, energy conversion, and computational modeling using DFT and molecular dynamics.
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
Anbieter: PBShop.store US, Wood Dale, IL, USA
PAP. Zustand: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Bestandsnummer des Verkäufers L0-9786208488246
Anzahl: Mehr als 20 verfügbar
Anbieter: California Books, Miami, FL, USA
Zustand: New. Bestandsnummer des Verkäufers I-9786208488246
Anzahl: Mehr als 20 verfügbar
Anbieter: PBShop.store UK, Fairford, GLOS, Vereinigtes Königreich
PAP. Zustand: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Bestandsnummer des Verkäufers L0-9786208488246
Anzahl: Mehr als 20 verfügbar
Anbieter: Grand Eagle Retail, Bensenville, IL, USA
Paperback. Zustand: new. Paperback. This comprehensive book offers an in-depth exploration of the essential methodologies in single-crystal X-ray diffraction (SCXRD) and structural crystallography. It provides a clear, step-by-step pathway from the acquisition of raw diffraction data to the final validation of refined crystal structures. Beginning with the principles of data collection and reflection indexing, the book guides readers through the intricacies of data treatment, quality assessment, and symmetry determination. Special emphasis is placed on best practices for applying space-group analysis, refining atomic models, and ensuring the reliability of structural results.Designed to serve both as a teaching tool and a reference work, this volume is intended for graduate students, researchers, and professionals in crystallography, materials science, and molecular sciences. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Bestandsnummer des Verkäufers 9786208488246
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware 88 pp. Englisch. Bestandsnummer des Verkäufers 9786208488246
Anzahl: 2 verfügbar
Anbieter: Books Puddle, New York, NY, USA
Zustand: New. Bestandsnummer des Verkäufers 26405263655
Anzahl: 4 verfügbar
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
Zustand: New. Print on Demand. Bestandsnummer des Verkäufers 407923448
Anzahl: 4 verfügbar
Anbieter: Biblios, Frankfurt am main, HESSE, Deutschland
Zustand: New. PRINT ON DEMAND. Bestandsnummer des Verkäufers 18405263661
Anzahl: 4 verfügbar
Anbieter: CitiRetail, Stevenage, Vereinigtes Königreich
Paperback. Zustand: new. Paperback. This comprehensive book offers an in-depth exploration of the essential methodologies in single-crystal X-ray diffraction (SCXRD) and structural crystallography. It provides a clear, step-by-step pathway from the acquisition of raw diffraction data to the final validation of refined crystal structures. Beginning with the principles of data collection and reflection indexing, the book guides readers through the intricacies of data treatment, quality assessment, and symmetry determination. Special emphasis is placed on best practices for applying space-group analysis, refining atomic models, and ensuring the reliability of structural results.Designed to serve both as a teaching tool and a reference work, this volume is intended for graduate students, researchers, and professionals in crystallography, materials science, and molecular sciences. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Bestandsnummer des Verkäufers 9786208488246
Anzahl: 1 verfügbar
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This comprehensive book offers an in-depth exploration of the essential methodologies in single-crystal X-ray diffraction (SCXRD) and structural crystallography. It provides a clear, step-by-step pathway from the acquisition of raw diffraction data to the final validation of refined crystal structures. Beginning with the principles of data collection and reflection indexing, the book guides readers through the intricacies of data treatment, quality assessment, and symmetry determination. Special emphasis is placed on best practices for applying space-group analysis, refining atomic models, and ensuring the reliability of structural results.Designed to serve both as a teaching tool and a reference work, this volume is intended for graduate students, researchers, and professionals in crystallography, materials science, and molecular sciences.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 88 pp. Englisch. Bestandsnummer des Verkäufers 9786208488246
Anzahl: 1 verfügbar