[Defect-oriented Testing for Nano-metric CMOS VLSI Circuits] (By: Manoj Sachdev) [published: February, 2010] - Softcover
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Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits
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Soft cover. Zustand: New. ISBN:9788184894295,Territorial restriction maybe printed on the book. This is an Int'l edition, ISBN and cover may differ from US edition, Contents same as US edition. Bestandsnummer des Verkäufers 2438289
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DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
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New Age International Publisher, 2010
ISBN 10: 8184894295
ISBN 13: 9788184894295
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DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Verlag:
New Age International Publisher, 2010
ISBN 10: 8184894295
ISBN 13: 9788184894295
Neu
Softcover
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DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
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