Inhaltsangabe
1 Introduction. 1.1 Motivation. 1.2 Contributions. 1.3 Overview of the Book.
2 Background. 2.1 High-Speed Serial Communications. 2.2 Timing Jitter. 2.3 Amplitude Noise.
3 Accelerating Receiver Jitter Tolerance Testing on ATE. 3.1 Introduction. 3.2 Jitter Test Signal Generation. 3.3 Receiver Bit Error Monitoring. 3.4 Jitter Tolerance Extrapolation. 3.5 Other Applications of the New Method.
4 Transmitter Jitter Extractions on ATE. 4.1 Introduction. 4.2. Test Setup for Data Acquisition. 4.3. Jitter Extraction. 4.4 Experimental Results. 4.5 Summary.
5 Testing HSSIs with or without ATE Instruments. 5.1 DFT in HSSIs. 5.2 FPGA-based Bit Error Detection. 5.3 Loopback Testing with Jitter Injection. 5.4 A Versatile HSSI Testing Scheme.
6 BER Testing Under Noise. 6.1 AWGN Generation Overview. 6.2 Our Implementation. 6.3 Baseband Transmission Testing. 6.4 Advantages of Our AWGN Generator.
7 Conclusions.
Reference. Index.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
