This Solution Manual, a companion volume of the book, Fundamentals of Solid-State Electronics, provides the solutions to selected problems listed in the book. Most of the solutions are for the selected problems that had been assigned to the engineering undergraduate students who were taking an introductory device core course using this book.This Solution Manual also contains an extensive appendix which illustrates the application of the fundamentals to solutions of state-of-the-art transistor reliability problems which have been taught to advanced undergraduate and graduate students.
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Paperback. Zustand: new. Paperback. This companion to "Fundamentals of Solid-State Electronics - Study Guide" provides the solutions to selected problems listed in the book. Most of the solutions are for selected assigned problems from an introductory device core course taught to engineering undergraduates at the University of Florida from 1991 to 1996. The manual also contains an extensive appendix on state-of-the-art transistor reliability physics and engineering discussions and solutions which have been taught to advanced undergraduate and graduate students at that university. Accompanying the "Study Guide", this manual provides solutions for selected problems from both an introductory device core course for undergraduates, and a transistor reliability physics course and engineering discussions for advanced undergraduate/graduate students, taught at Florida University. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Bestandsnummer des Verkäufers 9789810228811
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Zustand: New. Accompanying the "Study Guide", this manual provides solutions for selected problems from both an introductory device core course for undergraduates, and a transistor reliability physics course and engineering discussions for advanced undergraduate/graduate students, taught at Florida University. Editor(s): Caelli, Terry Michael. Num Pages: 212 pages, diagrams, figures. BIC Classification: PHFC; TJFC; TJFD5. Category: (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate; (XX) Exams / tests / exercises. Dimension: 250 x 150 x 10. Weight in Grams: 295. . 1996. Illustrated. paperback. . . . . Bestandsnummer des Verkäufers V9789810228811
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Anbieter: Kennys Bookstore, Olney, MD, USA
Zustand: New. Accompanying the "Study Guide", this manual provides solutions for selected problems from both an introductory device core course for undergraduates, and a transistor reliability physics course and engineering discussions for advanced undergraduate/graduate students, taught at Florida University. Editor(s): Caelli, Terry Michael. Num Pages: 212 pages, diagrams, figures. BIC Classification: PHFC; TJFC; TJFD5. Category: (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate; (XX) Exams / tests / exercises. Dimension: 250 x 150 x 10. Weight in Grams: 295. . 1996. Illustrated. paperback. . . . . Books ship from the US and Ireland. Bestandsnummer des Verkäufers V9789810228811
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