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CMOS RF Circuit Design for Reliability and Variability (SpringerBriefs in Reliability) - Softcover

Yuan, Jiann-Shiun

 
9789811008825: CMOS RF Circuit Design for Reliability and Variability (SpringerBriefs in Reliability)
Softcover
ISBN 10: 9811008825 ISBN 13: 9789811008825
Verlag: Springer, 2016

Inhaltsangabe

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

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Verlag
Springer
Erscheinungsdatum
2016
Sprache
Englisch
ISBN 10 
9811008825
ISBN 13 
9789811008825
Einband
Taschenbuch
Auflage
1
Anzahl der Seiten
112
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