VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers: 711 (Communications in Computer and Information Science) - Softcover

Softcover

ISBN 10: 9811074690 ISBN 13: 9789811074691

Verlag: Springer, 2017

Inhaltsangabe

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

Über diesen Titel

Reseña del editor

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

Details zur Ausgabe

• Verlag: Springer
• Erscheinungsdatum: 2017
• Sprache: Englisch
• ISBN 10: 9811074690
• ISBN 13: 9789811074691
• Einband: Tapa blanda
• Auflage: 1
• Anzahl der Seiten: 840
• Herausgeber: Kaushik Brajesh Kumar, Dasgupta Sudeb, Singh Virendra
• Kontakt zum Hersteller: Nicht verfügbar
• Verantwortliche Person: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Deutschland