Materials metrology, a burgeoning branch of the field, is a subject of intense scrutiny by both researchers and stakeholders. The focal points of their attention are twofold: understanding the objectives of material metrology research and determining effective methods for utilizing its findings. Researchers and stakeholders delve into the intricacies of ensuring traceability of complex units from equipment and maintaining consistency in measurement results across various methods. The application of materials metrology extends to calibrating equipment and/or measurement methods, as well as utilizing critical data for production assessments. Graphene's emergence sparked widespread interest across various fields. The rapid progress of graphene and related two-dimensional materials in both research and industrial applications necessitates robust support from metrology, standards, and conformity assessment, collectively known as national quality infrastructures (NQI). This book, using graphene and related two-dimensional materials as exemplars, explores fundamental concepts and terminologies of metrology and materials metrology, elucidates the technological framework of metrology and standards, and elaborates on various metrological techniques for the structural characterization of graphene and related materials, including Raman spectroscopy, X-ray diffraction, atomic force microscopy, and electron microscopy. Additionally, the book presents techniques for quality evaluation, such as X-ray photoelectron spectroscopy, inductively coupled plasma mass spectrometry, and Fourier transform infrared spectrometry. By leveraging established standard measurement instruments, reference materials, measurement methods, and interlaboratory comparisons, this book endeavors to attain accurate and consistent measurement results. Globally equivalent results can guarantee the quality of graphene products, fostering standardization, mass production, and sustainable advancement within the graphene industry.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Anbieter: GreatBookPrices, Columbia, MD, USA
Zustand: New. Bestandsnummer des Verkäufers 48362244-n
Anzahl: Mehr als 20 verfügbar
Anbieter: California Books, Miami, FL, USA
Zustand: New. Bestandsnummer des Verkäufers I-9789811295706
Anzahl: Mehr als 20 verfügbar
Anbieter: GreatBookPrices, Columbia, MD, USA
Zustand: As New. Unread book in perfect condition. Bestandsnummer des Verkäufers 48362244
Anzahl: Mehr als 20 verfügbar
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Zustand: New. In. Bestandsnummer des Verkäufers ria9789811295706_new
Anzahl: Mehr als 20 verfügbar
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
Zustand: As New. Unread book in perfect condition. Bestandsnummer des Verkäufers 48362244
Anzahl: Mehr als 20 verfügbar
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
Zustand: New. Bestandsnummer des Verkäufers 48362244-n
Anzahl: Mehr als 20 verfügbar
Anbieter: Rarewaves.com USA, London, LONDO, Vereinigtes Königreich
Hardback. Zustand: New. Materials metrology, a burgeoning branch of the field, is a subject of intense scrutiny by both researchers and stakeholders. The focal points of their attention are twofold: understanding the objectives of material metrology research and determining effective methods for utilizing its findings. Researchers and stakeholders delve into the intricacies of ensuring traceability of complex units from equipment and maintaining consistency in measurement results across various methods. The application of materials metrology extends to calibrating equipment and/or measurement methods, as well as utilizing critical data for production assessments.Graphene's emergence sparked widespread interest across various fields. The rapid progress of graphene and related two-dimensional materials in both research and industrial applications necessitates robust support from metrology, standards, and conformity assessment, collectively known as national quality infrastructures (NQI). This book, using graphene and related two-dimensional materials as exemplars, explores fundamental concepts and terminologies of metrology and materials metrology, elucidates the technological framework of metrology and standards, and elaborates on various metrological techniques for the structural characterization of graphene and related materials, including Raman spectroscopy, X-ray diffraction, atomic force microscopy, and electron microscopy. Additionally, the book presents techniques for quality evaluation, such as X-ray photoelectron spectroscopy, inductively coupled plasma mass spectrometry, and Fourier transform infrared spectrometry. By leveraging established standard measurement instruments, reference materials, measurement methods, and interlaboratory comparisons, this book endeavors to attain accurate and consistent measurement results.Globally equivalent results can guarantee the quality of graphene products, fostering standardization, mass production, and sustainable advancement within the graphene industry. Bestandsnummer des Verkäufers LU-9789811295706
Anzahl: Mehr als 20 verfügbar
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Hardcover. Zustand: Brand New. 243 pages. 6.00x0.85x9.00 inches. In Stock. Bestandsnummer des Verkäufers x-9811295700
Anzahl: 2 verfügbar
Anbieter: preigu, Osnabrück, Deutschland
Buch. Zustand: Neu. QUALITY INFRASTRUC GRAPHENE & RELATED TWO-DIMENSION MATERIAL | Ren Lingling | Buch | Englisch | 2024 | World Scientific | EAN 9789811295706 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand. Bestandsnummer des Verkäufers 129453859
Anzahl: 5 verfügbar
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Materials metrology, a burgeoning branch of the field, is a subject of intense scrutiny by both researchers and stakeholders. The focal points of their attention are twofold: understanding the objectives of material metrology research and determining effective methods for utilizing its findings. Researchers and stakeholders delve into the intricacies of ensuring traceability of complex units from equipment and maintaining consistency in measurement results across various methods. The application of materials metrology extends to calibrating equipment and/or measurement methods, as well as utilizing critical data for production assessments.Graphene's emergence sparked widespread interest across various fields. The rapid progress of graphene and related two-dimensional materials in both research and industrial applications necessitates robust support from metrology, standards, and conformity assessment, collectively known as national quality infrastructures (NQI). This book, using graphene and related two-dimensional materials as exemplars, explores fundamental concepts and terminologies of metrology and materials metrology, elucidates the technological framework of metrology and standards, and elaborates on various metrological techniques for the structural characterization of graphene and related materials, including Raman spectroscopy, X-ray diffraction, atomic force microscopy, and electron microscopy. Additionally, the book presents techniques for quality evaluation, such as X-ray photoelectron spectroscopy, inductively coupled plasma mass spectrometry, and Fourier transform infrared spectrometry. By leveraging established standard measurement instruments, reference materials, measurement methods, and interlaboratory comparisons, this book endeavors to attain accurate and consistent measurement results.Globally equivalent results can guarantee the quality of graphene products, fostering standardization, mass production, and sustainable advancement within the graphene industry. Bestandsnummer des Verkäufers 9789811295706
Anzahl: 1 verfügbar