Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices (Selected topics in Electronics and Systems, Band 34) - Hardcover

Fleetwood, Daniel M.

 
9789812389404: Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices (Selected topics in Electronics and Systems, Band 34)
Hardcover
ISBN 10: 9812389407 ISBN 13: 9789812389404
Verlag: Wspc, 2004

Inhaltsangabe

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (Mos), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

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Verlag
Wspc
Erscheinungsdatum
2004
Sprache
Englisch
ISBN 10 
9812389407
ISBN 13 
9789812389404
Einband
Gebundene Ausgabe
Anzahl der Seiten
348
Kontakt zum Hersteller
preigu GmbH & Co. KG
mail@preigu.de

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