Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics)

Nelson, Wayne B.

ISBN 10: 0471522775 / ISBN 13: 9780471522775

Verlag: Wiley-Interscience, 1990

Beschreibung

Binding is unblemished, text block is clean, boards straight, without highlights or markings. Mild rubbing/chipping to dust wrapper edges. Previous owners name stamped lightly on fore-edge. Supporting Bay Area Friends of the Library since 2010. Well packaged and promptly shipped.

Bestandsnummer des Verkäufers 1LAUHV002X0I

Bibliografische Details

• Titel: Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics)
• Verlag: Wiley-Interscience
• Erscheinungsjahr: 1990
• Sprache: Englisch
• ISBN-10: 0471522775
• ISBN-13: 9780471522775
• Einband: Hardcover
• Zustand: Good

Über diesen Titel

Inhaltsangabe

Many manufacturers invest much time and money in product reliability in order to maximize quality and competitiveness. This book provides practical, modern statistical methods for accelerated testing - a process by which products can be life tested at high stress conditions to yield failures quickly. The author presents accelerated test models, data analyses and test plans.

Über die Autorin bzw. den Autor

Wayne B. Nelson, PHD, is a leading expert on analysis of reliability and accelerated test data. Formerly with General Electric Research & Development for twenty-three years, he now privately consults on and teaches engineering applications of statistics for many companies, professional societies, and universities. For his outstanding contributions to reliability data analysis and accelerated testing, he was elected a fellow of the Institute of Electrical and Electronics Engineers, the American Society for Quality, and the American Statistical Association. DR. WAYNE NELSON IS AWARDED THE SHEWHART MEDAL American Society for Quality awarded Dr. Wayne Nelson of Schenectady, New York the 2003 Shewhart Medal. The Medal honors his outstanding technical leadership, particularly for innovative developments and applications of theory and methods for analyzing quality, reliability, and accelerated test data, and for widely disseminating such developments through his books and many publications, talks, and courses. The Shewhart Medal for outstanding technical leadership is named after Dr. Walter A. Shewhart, who pioneered statistical methods for controlling and improving the quality of manufactured products. These methods contributed significantly to the United States' war effort in World War II. Subsequently taken to Japan by Dr. W. Edwards Deming, these methods revolutionized Japan's industries. Today these methods are part of widely used Six Sigma training on how to improve the quality of products and services. The American Society for Quality is the world's largest professional society dedicated to the improved quality of products and services. It serves its members and the public through a variety of educational activities, including conferences, training courses, journals, and books. Dr. Nelson is a graduate of the California Institute of Technology (Caltech) and the University of Illinois. Formerly with GE Research & Development, he now privately consults and gives courses for companies, professional societies, and universities. For his technical contributions, he was elected a Fellow of the American Society for Quality, the American Statistical Association, and the Institute of Electrical and Electronic Engineers. He recently spent four months in Argentina on a Fulbright Award, lecturing on analysis of product reliability data.