Advanced Mathematical And Computational Tools In Metrology And Testing XI: 89 (Series on Advances in Mathematics for Applied Sciences)

Franco Pavese,Sascha Eichstädt,Anna Chunovkina,Nien-Fan Zhang,Alistair B Forbes

ISBN 10: 9813274298 / ISBN 13: 9789813274297

Verlag: World Scientific Publishing Comp, 2018

Beschreibung

Bestandsnummer des Verkäufers mon0000193316

Bibliografische Details

Titel: Advanced Mathematical And Computational ...

Verlag: World Scientific Publishing Comp

Erscheinungsdatum: 2018

Einband: Hardcover

Zustand: Very Good

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Inhaltsangabe:

This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and for evaluation of the measurement uncertainty, and describe their applications in a wide range of measurement areas.

This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.

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This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adopted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools Metrology conference held at the University of Strathclyde, Glasgow, in September, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and evaluation measurement uncertainty, and describe their applications in a wide range of measurement areas.

This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.