Advanced Radiation Shielding Materials. Dieser Artikel ist nicht verfügbar.
Sprache: Englisch
Verlag: Elsevier, 2024
- Softcover
- Neu

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Zustand: Neu
EUR 394,47
Artikelbeschreibung des Verkäufers
2024. 1st Edition. paperback. . . . . . Books ship from the US and Ireland.
Bestandsnummer des Verkäufers V9780323953870
- Titel
- Advanced Radiation Shielding Materials
- Autor
- Verma, Sarika
- Verlag
- Elsevier
- Erscheinungsjahr
- 2024
- Zustand
- New
- Einband
- Softcover
- Sprache
- Englisch
- ISBN-10
- 0323953875
- ISBN-13
- 9780323953870
Advanced Radiation Shielding Materials: Radiation and Radiological Protection provides an in-depth evaluation of the different types of radiation (x-rays, gamma rays, neutron, UV and EMI) and the development of radiation shielding materials that can be exploited for designing and use in multiple applications. The book also presents a review of the process parameters necessary to develop radiation shielding materials which will assist in the ongoing research to optimize and enhance processes such as the use of 3D orienting and CVD to create efficient radiation shielding material.
This book will play a pivotal role and opens new avenues for global research and development by providing an understanding of the mechanisms of radiation shielding and bringing these concepts to application using different materials.
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Über die Autorin bzw. den Autor
Sarika Verma is Principal Scientist at Materials for Radiation Shielding and Cement-free Concrete Division, CSIR-Advanced Materials and Processes Research Institute (AMPRI), Bhopal, India. Her research interests focus on advanced materials for different broad application spectrums, including cement-free materials, radiation shielding materials, polymeric composites, and biomedical and energy materials via novel techniques.
Avanish Kumar Srivastava is the director of the CSIR-AMPRI, Bhopal, India. He is an expert in nanoscale measurements and instrumentation, and his research interests lie in nucleation growth, phase transformations, microstructures, and defects.
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