*Price HAS BEEN temporarily REDUCED by 10% until Monday, Sept. 8 (sale item)* Second printing, 454 pp., hardcover, ex library, else text clean and binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.

Bestandsnummer des Verk�ufers ZB1316271

Verk�ufer kontaktieren

Diesen Artikel melden

Bibliografische Details

Titel

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Verlag

Plenum Press

Erscheinungsjahr

1987

Sprache

Englisch

ISBN-10

0306421402

ISBN-13

9780306421402

Einband

Hardcover

Zustand

Good

Verk�uferkataloge

�ber diesen Titel

Inhaltsangabe

This book has its origins in the intensive short courses on scanning elec� tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con� tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro� ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan� ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol� ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol� ume, including those on magnetic contrast and electron channeling con� trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel� opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.

Rese�a del editor

This book has its origins in the intensive short courses on scanning elec- tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con- tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro- ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan- ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol- ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol- ume, including those on magnetic contrast and electron channeling con- trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel- opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.

��ber diesen Titel� kann sich auf eine andere Ausgabe dieses Titels beziehen.

Anbieterinformationen

Zubal Books is the #1 buyer and seller of scholarly and rare books in America. Since 1961 we've handled thousands of private and technical libraries. Our family business knows books and we treat our clients with top-notch customer service. If you have any questions about our listings, please don't hesitate to contact us. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country

Zur Homepage des Verk�ufers

Unternehmensdaten des Verk�ufers

Zubal Books
2969 West 25th Street, Cleveland, OH, 44113, U.S.A.

Gesch�ftsbedingungen und Versandinformationen

Verkaufsbedingungen

Price are net to all
Visa/MC/Check/Money Order
Libraries Invoiced

We do accept checks, however
WE DO NOT HOLD OR RESERVE ANY ITEMS

All international postal rates are subject to change depending on weight
and size.

Widerrufsbelehrung

Versandbedingungen

Orders usually ship within 2 business days. Shipping costs are based on books
weighing 2.2 LB, or 1 KG. If your book order is heavy or oversized, we may
contact
you to let you know extra shipping is required.

Buyer is responsible for any additional duties, taxes, or fees required by recipient's country

Versandkosten innerhalb von USA

Versandkosten innerhalb von USA
Bestellmenge	4 bis 14�Werktage	3 bis 5�Werktage
Erster Artikel	EUR 3.84	EUR 11.95

Die Versandzeiten werden von den Verk�uferinnen und Verk�ufern festgelegt. Sie variieren je nach Versanddienstleister und Standort. Sendungen, die den Zoll passieren, k�nnen Verz�gerungen unterliegen. Eventuell anfallende Abgaben oder Geb�hren sind von der K�uferin bzw. dem K�ufer zu tragen. Die Verk�uferin bzw. der Verk�ufer kann Sie bez�glich zus�tzlicher Versandkosten kontaktieren, um einen m�glichen Anstieg der Versandkosten f�r Ihre Artikel auszugleichen.

Impressum & Info zum Verk�ufer