Advanced Verification Topics

Bhattacharya, Bishnupriya; Decker, John; Hall, Gary; Heaton, Nick; Kashai, Yaron; Khan, Neyaz; Kirshenbaum, Zeev; Shneydor, Efrat

ISBN 10: 1105113752 / ISBN 13: 9781105113758

Verlag: Lulu.com, 2011

Bestandsnummer des Verkäufers 1105113752-3-34680381

Inhaltsangabe:

The Accellera Universal Verification Methodology (UVM) standard is architected to scale, but verification is growing and in more than just the digital design dimension. It is growing in the SoC dimension to include low-power and mixed-signal and the system integration dimension to include multi-language support and acceleration. These items and others all contribute to the quality of the SOC so the Metric-Driven Verification (MDV) methodology is needed to unify it all into a coherent verification plan. This book is for verification engineers and managers familiar with the UVM and the benefits it brings to digital verification but who also need to tackle specialized tasks. It is also written for the SoC project manager that is tasked with building an efficient worldwide team. While the task continues to become more complex, Advanced Verification Topics describes methodologies outside of the Accellera UVM standard, but that build on it, to provide a way for SoC teams to stay productive and profitable.

Bibliografische Details

Titel: Advanced Verification Topics
Verlag: Lulu.com
Erscheinungsdatum: 2011
Einband: paperback
Zustand: Good