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Bibliografische Details

Titel: Advances in X-Ray Analysis, Vol. 36
Verlag: Springer
Erscheinungsjahr: 1993
Sprache: Englisch
ISBN-10: 0306445719
ISBN-13: 9780306445712
Einband: Hardcover
Zustand: Good

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Inhaltsangabe

Mathematical Techniques in XRay Spectrometry: Research in the Quantitative Analysis of Individual Particles by XRay Fluorescence Spectrometry (M. Lankosz et al.). Analysis of Light Elements by XRay Spectrometry: XRFA of Carbon in Steels (F. Weber et al.). XRS Techniques and Instrumentation: Diffraction Peaks in XRay Spectroscopy (R.G.Tissot, R.P. Goehner). OnLine, Industrial, and Other Applications of XRS: Application of XRF in the Aluminum Industry (F.R. Feret). XRay Characterization of Thin Films: Grazing Incidence XRay Characterization of Materials (D.K. Bowen, M. Wormington). WholePattern Fitting, Phase Analysis by Diffraction Methods: Phase Identification Using WholePattern Matching (D.K. Smith et al.). Polymer Applications of XRD. HighTemperature and NonAmbient Applications of XRD. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis. XRD Techniques and Instrumentation. 71 additional articles. Index.

Rese�a del editor

Proceedings of the 41st Annual Conference on Applications of X-ray Analysis, held at Colorado Springs, Colorado in August 1992. The volume is divided into ten sections: mathematical techniques in x-ray spectrometry; analysis of light elements by x-ray spectrometry; XRS techniques and instrumentation

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