Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits von Roberts Gordon W. Lu Albert K.: New (1995)

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pp. 136 9:B&W 6 x 9 in or 229 x 152 mm Case Laminate on Creme w/Gloss Lam.

Bestandsnummer des Verk�ufers 5802985

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Bibliografische Details

Titel: Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
Verlag: Springer
Erscheinungsjahr: 1995
Sprache: Englisch
ISBN-10: 0792395646
ISBN-13: 9780792395645
Einband: Hardcover
Zustand: New

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Inhaltsangabe

Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.

Rese�a del editor

Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.

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