Characterization of materials Pt. 1 : Materials Science and Technology :

Cahn, R.W., P. Haasen and E.J. Kramer:

ISBN 10: 3527268154 / ISBN 13: 9783527268153

Verlag: Weinheim, VCH, 1992

Beschreibung

724 Seiten : mit Abbildungen : Ausgesondertes Bibliotheksexemplar mit den zugehörigen Kennzeichnungen, Klebespuren von Bibliotheksaufkleber auf Buchrücken, Stempel auf Titelseite, Aufkleber, Stempel und RFID-Chip im Nachsatz, ansonsten in sehr gutem Zustand und nur sehr leicht lager- und gebrauchsspurig DE-100-01 Sprache: Englisch Gewicht in Gramm: 1458.

Bestandsnummer des Verkäufers 1887049

Bibliografische Details

• Titel: Characterization of materials Pt. 1 : Materials Science and Technology :
• Verlag: Weinheim, VCH
• Erscheinungsjahr: 1992
• Sprache: Englisch
• ISBN-10: 3527268154
• ISBN-13: 9783527268153
• Einband: Gr.-8°, gebundene Ausgabe
• Auflage: Volume 2A.
• Zustand: Sehr gut
• Gewicht: 1458 Gramm
• Verkäuferkataloge:
  • Technik

Über diesen Titel

Inhaltsangabe

Characterization is essential to the systematic development of new materials and understanding how they behave in practical applications. Throughout all the volumes of "Materials Science and Technology", the theme of linking properties with microstructure and chemical composition is repeated. Volume 2 focuses on the principal methods required to characterize metal alloys, semiconductors, polymers and ceramics. Modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase. Details of these phases can be very complex and usually vary with processing. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material or fabricated product unique. The challenge to the materials scientist, chemist or engineer is to know what information is needed to fully characterize each material or fabricated product and how to use this information to explain its behaviour, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. Today there are thousands of techniques used to characterize materials. The goal of Volume 2, which will be published in two parts, is to provide an introductory understanding of a number of the most important techniques. Each is described in sufficient detail so that the reader will develop an awareness of the instrumentation used, how it works, what kind of information it provides, and what are its limitations. Volume 2A concentrates on microscopic techniques that span a range of magnifications from that of the low magnification available with light optical microscopy, through scanning electron microscopy and finally to the very high resolution of transmission electron microscopy. Volume 2B adds to the methods described in 2A.

Von der hinteren Coverseite

Materials Science and Technology A Comprehensive Treatment Edited by R.W. Cahn, P. Haasen, E.J. Kramer The 18 volume series "Materials Science and Technology" is the first in-depth, topic-oriented reference work devoted to this growing interdisciplinary field. A compendium of current, state-of-the-art information, it covers the most important classes of materials: metals, ceramics, glasses, polymers, semiconductors, and composites. Each volume deals with properties, processing, applications, or general phenomena associated with these materials. Edited by internationally renowned figures in materials science, this series is sure to establish itself as a seminal work. Volume 2A: This is the first of a two-part volume focusing on the principal analytical techniques for characterizing metal alloys, semiconductors, polymers and ceramics. Topics included are: electron diffraction and transmission electron microscopy ? analytical electron microscopy ? scanning electron microscopy ? X-ray diffraction ? light optical microscopy ? atomic spectroscopy ? thermoanalytical methods ? application of synchrotron X-radiation to problems in materials science ? X-ray fluorescence analysis ? polymer molecular structure determination.