The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500™ (Frontiers in Electronic Testing, 35)

Da Silva, Francisco; McLaurin, Teresa; Waayers, Tom

ISBN 10: 0387307516 / ISBN 13: 9780387307510

Verlag: Springer, 2006

Beschreibung

In.

Bestandsnummer des Verkäufers ria9780387307510_new

Bibliografische Details

• Titel: The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500? (Frontiers in Electronic Testing, 35)
• Verlag: Springer
• Erscheinungsjahr: 2006
• Sprache: Englisch
• ISBN-10: 0387307516
• ISBN-13: 9780387307510
• Einband: Hardcover
• Zustand: New

Über diesen Titel

Inhaltsangabe

The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500tm provides insight into the rules and recommendations of IEEE Std. 1500. This book focuses on practical design considerations inherent to the application of IEEE Std. 1500 by discussing design choices and other decisions relevant to this IEEE standard. The authors provide background information about some of the choices and decisions made throughout the design of IEEE Std. 1500.

Von der hinteren Coverseite

The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500^TM

provides insight into the rules and recommendations of IEEE Std. 1500. The authors present background information about some of the choices and decisions made throughout the

design of this IEEE standard conceived to enable efficient core test reuse and debug at the

SOC level.

The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500^TM focuses on practical design considerations and design choices inherent to the application of IEEE Std. 1500. This book teaches an engineer how to add a 1500 wrapper to their core in easy to understand steps. Starting with a bare core (a core without 1500 wrapper), the book progressively builds a 1500 compliant wrapper around this core while discussing overall requirements for each portion of the 1500 wrapper. The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500^TM is a very valuable reference for professionals and researchers in the areas of design for test, design for test reuse/design reuse, and SOC implementation.