Development History of IEC and IEEE High Voltage and High Current Test Standards(Chinese Edition)

GUO JI DA DIAN WANG WEI YUAN HUI D1.35 GONG ZUO ZU . FAN JIAN BIN . LI PENG . YIN YU DENG YI

ISBN 10: 7519836649 / ISBN 13: 9787519836641

Verlag: China Electric Power Press, 2019

Beschreibung

Paperback.Pub Date:2019-09 Pages:64 Language:Chinese Publisher:China Electric Power Press The authors have tried to clarify the difficulties in interpreting some standard clauses in the Development History of IEC\IEEE High Voltage and High Current Test Standards as much as possible. The revision of these clauses in the future can make the high voltage test standards clearer and more user-friendly. The Development History of IEC\IEEE High Voltage and High Current Test Standards first introduce.

Bestandsnummer des Verkäufers DR008409

Bibliografische Details

• Titel: Development History of IEC and IEEE High Voltage and High Current Test Standards(Chinese Edition)
• Verlag: China Electric Power Press
• Erscheinungsjahr: 2019
• Sprache: Englisch
• ISBN-10: 7519836649
• ISBN-13: 9787519836641
• Einband: paperback
• Zustand: New

Über diesen Titel

Inhaltsangabe

Language:Chinese.paperback.Pub Date:2019-09.publisher:China Electric Power Press.description:Paperback.Pub Date:2019-09 Pages:64 Language:Chinese Publisher:China Electric Power Press The authors have tried to clarify the difficulties in interpreting some standard clauses in the Development History of IECIEEE High Voltage and High Current Te